The Anritsu 68117C is a synthesized signal generator spanning 0.01 GHz to 8.4 GHz, designed for wireless, radar, and communication system test and measurement. It delivers fast frequency switching in automated test equipment and benchtop environments, with output power ranging from –125 dBm to +17 dBm and ultra-low phase noise performance. The instrument executes step sweeps across 1 to 10,000 steps with dwell times from 1 ms to 99 seconds per step, supporting list sweep storage of up to 2000 non-volatile points. Internal modulation generators provide seven waveforms including Gaussian noise, arbitrary waveforms, and pulse modulation with doublet, triplet, or quadruplet capability for radar blind spot testing. Oven-stabilized frequency reference maintains <5×10⁻¹⁰ per day stability. A compact 13.3 cm form factor optimizes ATE rack density while remote interface capability enables seamless test system integration.
Technical Specifications
• Frequency Range: 0.01 GHz to 8.4 GHz
• Output Power: Maximum +17 dBm; leveled output –120 dBm in 0.01 dB steps; minimum power –125 dBm
• Phase Noise: –107 dBc SSB at 10 kHz offset
• Frequency Stability: <5×10⁻¹⁰ per day (oven-stabilized reference)
• Frequency Resolution: 1 kHz standard; 0.1 Hz with Option 11
• Switching Speed: 5 ms typical; <15 ms + 1 ms/GHz or <40 ms maximum for step sweep
– Key Features
• Step sweep with variable steps (1 to 10,000), 1 kHz to full-range step sizes, dwell times 1 ms to 99 seconds per step
• List sweep: 1000 frequencies in volatile memory, 2000-point table in non-volatile memory
• Alternate sweep mode between two ranges with independent power level assignment
• Manual sweep with user-selectable steps or step size
• Seven internal modulation waveforms plus user-defined arbitrary waveforms
• Pulse modulation with doublet, triplet, quadruplet, and swept delay for target simulation
• Simultaneous synchronized modulations for complex signal generation
– Typical Applications
• Automated test equipment for wireless and communication systems
• Radar system characterization and blind spot testing
• ATE rack integration with optimized compact footprint
– Compatibility & Integration
Remote interface support enables straightforward integration into multi-instrument test setups. Part of the Anritsu 68C/69B series.
