The Anritsu 68347C is a synthesized high-performance signal generator spanning 10 MHz to 20 GHz, engineered for RF and microwave component testing in ATE and R&D environments. It delivers +17 dBm guaranteed leveled power across its full range with 1 kHz frequency resolution and 0.01 dB output power steps. The instrument combines ultra-low SSB phase noise (-107 dBc at 10 kHz offset from 10 GHz), sub-5 ms switching time, and advanced modulation flexibility—AM, FM, pulse, phase, and scan modes with seven internal waveforms plus user-defined options. Pulse modulation supports radar blind spot simulation, recovery time testing, and moving target emulation. Sweep capabilities span digital frequency and power sweep, analog sweep, step sweep with up to 10,000 phase-locked steps adjustable from 1 ms to 99 seconds per step, logarithmic sweep, and alternate sweep between two ranges. List mode stores up to 4 tables with 2000 non-sequential frequency/power sets. Optional 110 dB step attenuator (Option 2A) extends dynamic range to -120 dBm minimum output; Option 11 provides 0.1 Hz frequency resolution. Internal noise generators (Gaussian and uniform) support controlled jitter in digital receiver testing. Output power flatness remains within 4.0 dB (0.01–0.05 GHz) and 2.0 dB (0.05–20 GHz) typical. Less than 5 ms switching time enables rapid frequency and power transitions across demanding automated test sequences.
Technical Specifications
• Frequency Range: 10 MHz to 20 GHz
• Frequency Resolution: 1 kHz standard; 0.1 Hz with Option 11
• Output Power: +17 dBm guaranteed leveled power to 20 GHz; +13 to -15 dBm typical; -120 dBm minimum with attenuator; -125 dBm minimum power; +11 dBm with step attenuator
• Output Power Steps: 0.01 dB
• Output Power Flatness: 4.0 dB (0.01–0.05 GHz); 2.0 dB (0.05–20 GHz) typical
• SSB Phase Noise: -107 dBc at 10 kHz offset from 10 GHz
• Switching Time: Less than 5 ms
• Step Attenuator (Option 2A): 110 dB range in 10 dB steps
– Key Features
• AM, FM, phase, pulse, and scan modulation with seven internal waveforms
• Pulse modulation for radar simulation, blind spot testing, recovery time analysis, and moving target emulation
• Digital and analog frequency sweep; digital power sweep
• Step sweep: 1 to 10,000 steps, 1 kHz resolution, 1 ms to 99 seconds per step
• Log sweep with frequency-dependent step scaling
• Alternate sweep mode between two independent ranges
• Manual stepped sweep with phase-locked adjustment
• List mode: 4 tables × 2000 frequency/power sets
• Gaussian and uniform noise generators for jitter simulation
• Dwell time: 20 ms to 99 seconds per step
• Ultra-low spurious signals
– Typical Applications
• RF and microwave component characterization
• Radar receiver and transceiver testing
• Digital receiver validation with controlled jitter
• Automated test equipment integration
• Phase-locked frequency and power stepping
– Compatibility & Integration
Designed for ATE environments and laboratory R&D with automated control interfaces supporting complex signal sequences.
