The Anritsu MS9703C is a high-performance optical spectrum analyzer engineered for precise characterization of optical devices and systems across the 600 nm to 1750 nm wavelength range. It delivers wavelength accuracy better than ±20 pm post-calibration, variable resolution bandwidth down to ≥0.07 nm, and input level measurement from –90 to +10 dBm depending on wavelength band. The instrument combines fast sweep speeds with dynamic range exceeding 42 dB at 0.2 nm in normal mode and 60 dB at 0.4 nm in high dynamic range mode, enabling detailed spectral analysis of DWDM systems with 50 GHz (0.4 nm) channel spacing. With a built-in optical attenuator for level control and SNR performance of ≥35 dB at 1300/1550 nm, the MS9703C supports quantitative measurement of signal quality across up to 300 DWDM channels.
## Technical Specifications
**Wavelength Performance**
• Wavelength range: 600 nm to 1750 nm
• Wavelength accuracy: better than ±20 pm (post-calibration with optional internal reference)
• Resolution bandwidth (RBW): ≥0.07 nm, ≥0.1 nm, ≤0.1 nm; configurable settings at 0.2 nm, 0.5 nm, and 1 nm
• Option 15 enhances accuracy, resolution, power flatness, and linearity in the 1570–1620 nm L-band region
**Level Measurement**
• Input range: –65 to +10 dBm (600–1000 nm); –85 to +10 dBm (1000–1250 nm); –90 to +10 dBm (1250–1600 nm)
• Level accuracy: ±0.1 dB to ±0.3 dB (1520–1620 nm, 0.5 nm resolution); ±0.05 dB (–50 to +20 dBm, optical attenuator on/off)
• Level stability: ±0.02 dB (1 min, RBW ≥0.1 nm, –23 dBm input)
• Level flatness: ±0.05 dB (1550/1600 nm); ±0.1 dB (1300 nm)
**Dynamic Range & SNR**
• Normal mode: >42 dB at 0.2 nm; minimum 58 dB at 0.4 nm; 62 dB at 1 nm
• High dynamic range mode: minimum 60 dB at 0.4 nm; minimum 70 dB at 1 nm
• Signal-to-noise ratio: ≥35 dB (1300/1550 nm)
## Key Features
• Built-in optical attenuator for precise level control
• Fast measurement speed
• Supports PMD and EDFA noise floor measurements
• Measures wavelength, power level, and SNR across up to 300 DWDM channels
## Typical Applications
• DWDM system characterization and verification
• Optical device and component testing
• Manufacturing and quality control
• Research and development in optical communications
