The Anritsu MS9740B is a benchtop optical spectrum analyzer engineered for evaluation of optical devices and systems across research, development, and production environments. It delivers broad wavelength coverage, high resolution, and extended dynamic range with fast sweep capability. The instrument provides nine pre-configured measurement menus optimized for laser diodes, optical amplifiers, WDM components, and transceiver characterization, enabling stable production testing and comprehensive spectral analysis from visible to infrared wavelengths.
Technical Specifications
• Wavelength Range: 600 nm to 1750 nm
• Dynamic Range: 42 dB to 70 dB; 45 dB minimum SMSR; 42 dB at 0.2 nm from peak
• Wavelength Accuracy: ±20 pm (standard option MS9740B-002); ±50 pm to ±300 pm (MS9740B-009); ±5 pm stability over 1 minute with smoothing
• Wavelength Resolution: 0.03 nm to 1 nm; minimum 0.03 nm in the 1550 nm band (MS9740B-009)
• Optical Power Range: −90 dBm to +23 dBm
• Maximum Input Power: +23 dBm (with optical attenuator enabled)
• Sweep Time: ≤0.2 s (5 nm span, 0.1 nm resolution); ≤0.3 s (500 nm span); 0.35 s/30 nm typical; 1.65 s/30 nm typical
• SMSR: 45 dB minimum with ±1.4 dB reproducibility
– Key Features
• Nine application-specific measurement menus for DFB-LD, FP-LD, LED, LD module, PMD, optical amplifier, WDM filter, and WDM spectrum analysis
• DWDM support for 50 GHz and 100 GHz channel spacing; simultaneous evaluation of up to 300 channels
• Optical pulse measurement mode without external trigger; suitable for thermal analysis at LD chip production
• Single-screen simultaneous display of center wavelength, optical level, OSNR, and spectrum width
• Dual measurement capability for optical filters and attenuators via reference comparison
• Automatic EDFA gain and noise figure calculation from optical input/output measurements
• Transceiver optical characterization compatible with BERT systems for electrical testing
• Measurement processing times reduced up to 50% versus MS9740A
– Typical Applications
LD module and DFB-LD characterization; FP-LD and LED spectral evaluation; PMD and optical amplifier testing; WDM filter and WDM spectrum analysis; optical transceiver qualification; EDFA performance assessment.
