The Anritsu MS9780A is a diffraction-grating spectrum analyzer engineered for high-resolution optical spectrum analysis across 600 to 1750 nm. It delivers precision measurements in research, development, and manufacturing environments, with particular strength in evaluating optical devices, laser and LED sources, passive component transmission characteristics, and optical amplifier performance metrics including noise figure and gain.
Technical Specifications
Wavelength Performance
• Range: 600 to 1750 nm (0.6 to 1.75 µm)
• Accuracy: ±0.3 nm across full range after external light source calibration; ±0.05 nm in the 1.52 to 1.57 µm band post-calibration
• Linearity: ±0.02 nm
• Resolution: 0.07 nm minimum (single-mode fiber); 0.1 nm (graded-index fiber); selectable settings at 0.07×2, 0.1, 0.2, 0.5, 1.0 nm
Level Measurement
• Range: –90 to +10 dBm (1250–1600 nm, attenuator off); –65 to +20 dBm (1100–1650 nm, attenuator on)
• Accuracy: ±0.6 dB at 1300/1500 nm (–23 dBm, resolution ≥0.2 nm); ±0.1 dB linearity (0 to –50 dBm)
• Stability: ±0.1 dB at 1550 nm (–23 dBm, ≥0.2 nm resolution, 1 minute)
• Dynamic Range: >70 dB (high-dynamic range mode); 62 dB (normal mode, 1 nm from peak)
• Sensitivity: –90 dBm guaranteed; RMS noise ≤–90 dBm (1.25–1.6 µm)
• Polarization Dependency: ±0.15 dB
Measurement Parameters
• Sweep Speed: 0.5 s typical (500 nm sweep width, normal mode, 10 kHz VBW)
• Sweep Width: 0 to 1200 nm
• Maximum VBW: 1 MHz
Hardware
• Input Fibers: Single-mode (9.5/125 µm), graded-index (50/125 µm, 62.5/125 µm)
• Display: 6.4 inch color TFT-LCD
• Memory: Two-trace storage (A, B)
• Interfaces: GPIB, RS-232C
– Key Features
• WDM communication measurement capability optimized for 1.55 µm band operation
• Superior stability and calibration support for demanding metrology applications
• Multi-fiber input compatibility for diverse test configurations
• Dual-trace memory for comparative analysis
– Typical Applications
• Laser diode and LED spectral characterization
• Optical isolator and passive component transmission analysis
• Optical amplifier noise figure and gain assessment
• WDM system validation and component qualification
