The Ascor 3000-522 is a complex measurement matrix module within the ASCOR 3000 Series VXI product line, delivering flexible, high-performance switching for advanced test and measurement systems. This C-size VXI module occupies 4 slots and integrates 40 high-voltage channels, 256 low-voltage channels, and 20 high-frequency channels with multiple output measurement capabilities. Signal paths route to a low-frequency digital multimeter, high-frequency digitizer, high-frequency counter, and LF/HF interconnect for comprehensive measurement coverage across DC through 26.5 GHz.
## Technical Specifications
• **Module Type:** Complex Measurement Matrix
• **Chassis Slots:** 4 slots (C-size VXI form factor)
• **Input Channels:** 40 HV, 256 LV, 20 HF
• **Output Measurement Blocks:** LF DMM, HF Digitizer, HF Counter, LF/HF Interconnect
• **Bandwidth:** DC to 26.5 GHz
• **Architecture:** Register-based with VXIplug&play driver support
• **Signal Integrity:** Shielded circuit boards and controlled transmission line design
## Key Features
• VXIbus compatible (System Specification revisions 1.2–1.4)
• Wide frequency coverage from DC to 26.5 GHz supports both low- and high-frequency measurement paths
• Mixed-signal channel architecture accommodates voltage, current, and RF signals in a single module
• Integrated high-frequency digitization and counting eliminate external instrumentation
• Delivered with VXIplug&play software drivers for immediate system integration
## Typical Applications
• Multi-channel high-speed switching for complex RF and analog test systems
• Integrated measurement and switching in production test environments
• System-level functional and parametric testing requiring simultaneous HV, LV, and HF signal routing
• Research and development test benches demanding flexibility across frequency ranges
## Compatibility & Integration
The 3000-522 integrates into any VXIbus chassis supporting System Specification revisions 1.2 through 1.4. Register-based programming and supplied Plug&Play drivers enable rapid integration into existing test frameworks without custom driver development.
