The EXFO IQ-5240 is a high-performance optical spectrum analyzer built for precision spectral characterization in telecommunications and optical component testing. This benchtop instrument delivers the resolution and speed required for demanding WDM testing, EDFA gain analysis, and drift measurements across the C-band and extended wavelength range.
## Technical Specifications
• **Wavelength Range:** 1250 nm to 1650 nm
• **Resolution Accuracy:** 65 pm
• **Filter Resolution Bandwidth:** 65 pm (C-band)
• **Dynamic Range:** >50 dBc @ 1 nm from peak
• **Wavelength Linearity:** ±0.1 dB over 20 dB range
• **Wavelength Repeatability:** ±0.05 dB
• **Polarization Dependency:** ±0.1 dB typical
• **Optical Rejection Ratio:** 40 dBc at 25 GHz (0.2 nm)
• **Scanning Speed:** 5000 data points over 50 nm span with 10 pm resolution in <1 second; alternatively 5000 data points over 25 nm span with 5 pm resolution in <1 second
• **Monochromator:** Double-pass Littman-Metcalf design
• **Wavelength Control:** Gearless DC motor with high-resolution encoder
## Key Features
• Double-pass Littman-Metcalf monochromator ensures premium filter resolution and high stability
• Gearless motor and encoder architecture minimize misalignment and inaccuracies
• Designed to meet 50 GHz spacing requirements
• GPIB interface for remote control and data collection
## Typical Applications
• WDM system characterization
• EDFA gain analysis
• Drift measurements on optical signals and devices
## Compatibility & Integration
• Modular design integrates into the IQ-200 Optical Test System
• GPIB interface for instrument control
• Standard EXFO optical interface; EUI connector adapters sold separately
