The HP/Agilent 54520A is a 2-channel monochrome digitizing oscilloscope delivering 1 GSa/s maximum sample rate and 500 MHz repetitive bandwidth for precise signal characterization in design, R&D, and manufacturing test environments. Real-time acquisition captures waveforms across dual channels at up to 500 MSa/s with 32,768-point record length per channel, while equivalent-time sampling extends repetitive bandwidth to 500 MHz. The instrument combines 8-bit standard resolution with optional 10-bit resolution via HP-IB averaging, dual-channel vertical sensitivity from 1 mV/div to 5 V/div, and comprehensive trigger modes including edge, pattern, glitch, and time-qualified variants. Peak detect identifies glitches as narrow as 1 ns in real time. FFT analysis, sequential single-shot acquisition, and dedicated front-panel controls for vertical, time base, and trigger settings enable rapid troubleshooting and waveform analysis.

## Technical Specifications

**Acquisition Performance**
• Maximum sample rate: 1 GSa/s (single channel), 500 MSa/s (dual channel)
• Record length: 32,768 points (real-time maximum)
• Resolution: 8 bits standard; 10 bits via HP-IB with averaging
• Real-time bandwidth: 250 MHz (1 channel), 125 MHz (2 channels)
• Repetitive bandwidth: 500 MHz (equivalent-time)

**Vertical System**
• Sensitivity: 1 mV/div to 5 V/div
• Input impedance: 1 MΩ ±1% or 50 Ω ±1%
• Input capacitance: 7 pF nominal
• DC gain accuracy: ±1.25% of full scale
• Maximum input (1 MΩ): ±250 V DC + AC (AC 8 averages): [(0.005%)(delta-t)+(100 ps + 0.1% of full scale)]

**Trigger System**
• Sensitivity (DC to 100 MHz): 0.5 div (internal), 0.0225 × signal range (external)
• Sensitivity (100 MHz to 500 MHz): 1.0 div (internal), 0.045 × signal range (external)
• Minimum pulse width: 1 ns
• Modes: Edge, pattern, glitch, time-qualified pattern, line, state, event-delayed, time-delayed

## Key Features

• Peak detect captures glitches as narrow as 1 ns in real-time mode
• Sequential single-shot acquisition for successive events
• Fast Fourier Transform (FFT) for frequency-domain analysis
• AC/DC input coupling
• 3.5-inch floppy disk drive for data storage
• Monochrome CRT display for waveform visualization

## Typical Applications

• High-frequency analog and digital signal troubleshooting
• Design verification and characterization
• Manufacturing test and quality assurance
• Signal integrity analysis requiring sub-nanosecond time resolution

## Compatibility & Integration

HP-IB connectivity enables remote control and data transfer for automated test systems.