The HP/Agilent 66321B is a single-output DC power supply engineered for testing digital wireless and battery-powered devices. It delivers precise voltage and current control across a 0–15 V, 0–3 A output range, with peak current capability up to 5 A for 7 ms transients. The instrument combines low output noise (1 mV rms, 6 mV peak-to-peak), fast transient response (<20 µs), and battery emulation features—including programmable internal resistance and negative resistance simulation—making it ideal for mobile device development and system integration.
Technical Specifications
• Output: 0–15 V, 0–3 A continuous; 5 A peak (7 ms)
• Programming accuracy (voltage): ±(0.05% + 10 mV) to ±10 mV; (current): ±(0.05% + 1.33 mA) to ±1.33 mA
• Voltage measurement accuracy: ±(0.03% + 5 mV)
• Ripple and noise (20 Hz–20 MHz): 1 mV rms, 6 mV peak-to-peak (voltage); 2 mA rms (current)
• Load regulation: 5 mV (voltage), 0.75 mA (current)
• Line regulation: 0.5 mV (voltage), 0.75 mA (current)
• Transient response: <20 µs to <35 µs; 70 mV voltage dip
• Settling time: <6 ms (standard), 2 ms (fast mode)
• Remote sensing: Available on load leads; up to 3 V total drop compensated
• Dynamic measurement: 4096-point buffer, 15 µs sampling interval, 50 ms total measurement time
• Input power: 125 W (100–230 VAC, 47–63 Hz)
• Dimensions: 212.8 × 88.1 × 435 mm; 9.07 kg
– Key Features
• Battery emulation with programmable internal resistance and charge state simulation
• Rapid transient response suitable for dynamic load testing
• Low output noise for sensitive device characterization
• Remote sensing capability for lead drop compensation
• Real-time dynamic measurement acquisition
– Typical Applications
• Mobile device and wireless handset power testing
• Battery-powered equipment development and validation
• Research and development labs requiring stable, programmable DC sources
• System integration and functional testing environments
– Compatibility & Integration
• GPIB (IEEE-488) interface with SCPI command language support
• Suitable for automated test systems and benchtop applications
