The Huntron Tracker 2000 I-V Curve Trace Pulse Generator is a power-off diagnostic instrument that captures and displays current-voltage signatures of electronic components installed on circuit boards. By applying a current-limited AC signal and comparing the resulting I-V curve against known good references, it identifies faulty devices—including those with subtle defects like leakage or substrate damage—without requiring complete circuit documentation. The integrated pulse generator enables dynamic testing of gate-fired devices such as SCRs, TRIACs, and optocouplers in active mode while the circuit remains unpowered.
## Technical Specifications
**Test Signal & Measurement:**
• Waveform: Sine wave
• Frequencies: 50/60 Hz, 400 Hz, 2000 Hz (200 Hz available on some models)
• Frequency accuracy: ±0.05% (crystal controlled)
• Impedance ranges: Four selectable (Low, Medium 1, Medium 2, High) with automatic scanning and high range lockout
• Display: 2.8-inch (7 cm) diagonal CRT
**Pulse Generator:**
• Output levels: 0 V to ±5 V DC, adjustable
• Modes: +Pulse, −Pulse, both positive and negative pulses, +DC, or −DC
• Duty cycle: Approximately 0% to 100% per polarity
**Power & Physical:**
• AC line voltage: 100 VAC, 115 VAC, or 230 VAC (selectable or fixed)
• Input frequency: 47 Hz to 400 Hz
• Power consumption: Maximum 20 W
• Line fuse: 1/4 Amp AGC (internal, operator replaceable)
• Dimensions: 11 in (L) × 9 in (W) × 4 in (H)
• Weight: Approximately 6.5 lbs (3.0 kg)
• Operating temperature: 0°C to +50°C
## Key Features
• In-circuit testing of components on installed PCBs
• Compare-A-Trace function for signature comparison against known good devices
• Qualitative analysis of digital, analog, hybrid semiconductors, and passive components
• Three-terminal and gate-fired device testing without full circuit power
• Automatic impedance range scanning with manual override capability
## Typical Applications
• Rapid fault isolation on PCBs with incomplete or missing documentation
• Detection of subtle failures: leakage currents, substrate damage, parametric drift
• In-circuit verification of SCRs, TRIACs, optocouplers, and semiconductor arrays without powering surrounding circuits
• Manufacturing and field service troubleshooting
## Compatibility & Integration
Designed for benchtop operation with standard 47–400 Hz AC mains. Low power consumption (≤20 W) and compact form factor support integration into service carts and portable test stations.
