The Interface Technology SR5030 is a variable voltage I/O module purpose-built for the SR5000 Digital Test Subsystem. It delivers 16 input and 16 output pins with programmable input levels and operates at 50 MHz data rates. The module supports RAM-backed and algorithmic pattern generation across multiple output formats—NRZ, RZ, RONE, RTC, and RI—with 10 timing generators per module and 100 ps edge placement resolution for precise signal timing control. It accommodates variable voltage I/O levels compatible with non-standard logic families and integrates with a broad ecosystem of sensors and actuators for industrial control and test applications.
## Technical Specifications
• **Module Type:** Variable Voltage I/O Module
• **System Compatibility:** SR5000 Digital Test Subsystem
• **Form Factor:** VXI C-size, single-slot card
• **Data Rate:** 50 MHz
• **I/O Pins:** 16 input and 16 output pins per module
• **Programmable Input Levels:** 4 per module
• **Vector Memory:** 64K vectors per channel
• **Timing Generators:** 10 per module
• **Edge Placement Resolution:** 100 ps
• **Output Data Formats:** NRZ, RZ, RONE, RTC, and RI
## Key Features
• Variable voltage I/O capability supports multiple logic families and non-standard voltage levels
• RAM-backed and algorithmic pattern generation for flexible stimulus and response testing
• 64K vector memory per channel enables complex test sequences
• 10 independent timing generators with 100 ps resolution for deterministic edge control
• Supports input/output voltage ranges from −12 V to +12 V (comparable to SR5031 module specifications)
## Typical Applications
• Industrial control testing requiring adaptable voltage levels
• Multi-logic-family sensor and actuator integration
• Precision timing and pattern-driven validation
• Non-standard logic level characterization
## Compatibility & Integration
Designed as a module within the SR5000 Digital Test Subsystem architecture. Compatible with National Instruments LabVIEW and LabWindows/CVI development environments.
