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JDS Uniphase MAP+1111110

SKU: MAP+1111110Categories: Modular Instrument Chassis
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The JDS Uniphase MAP+1111110 is a module designed for the MAP-220 platform. This module provides essential functionality for optical testing and measurement, ensuring high performance and reliability. Ideal for advanced optical network characterization.

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$2,100.00

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Equipment info

The JDS Uniphase MAP+1111110 is a mainframe and integrated controller unit within the MAP-200 platform, engineered for optical test and measurement applications. This modular chassis serves as the operational backbone for instrumentation cassettes, enabling dynamic reconfiguration across diverse optical characterization and testing workflows. The controller automatically identifies installed modules and manages system operation through a color display and 9-key interface, supporting both local and remote command structures. Field-replaceable power and thermal management components simplify maintenance in production and laboratory environments.

## Technical Specifications

• **Platform:** JDS Uniphase MAP-200 Series
• **Chassis Type:** Mainframe with integrated controller
• **Model Number:** MAP+1111110
• **Slot Capacity:** Typically 8 slots (Master configuration)
• **Module Compatibility:** Over 15 different MAP-200 instrumentation cassettes
• **Hot-Swappable Operation:** Cassettes insert and remove without system power-down
• **Firmware:** Dynamic MAP Firmware with automatic cassette identification
• **User Interface:** 9-key keypad for local control; color display for system visualization
• **Power Supply:** Field-replaceable module
• **Thermal Management:** Front-panel fans
• **Approximate Ship Weight:** 34 lbs

## Key Features

• Non-disruptive module swapping enables rapid system reconfiguration and maintenance
• Automatic cassette identification simplifies multi-instrument deployment
• Integrated controller reduces external instrumentation requirements
• Front-panel design supports flexible mounting and operational access
• RS-232 and GPIB remote interfaces for automated and networked test environments

## Typical Applications

• Multi-parameter optical network characterization
• Production test and validation workflows
• Research and development optical measurements
• Field service and troubleshooting in optical systems

## Compatibility & Integration

Designed for the MAP-200 platform ecosystem. Compatible 19-inch rackmount configuration available. Remote communication via RS-232, GPIB, and LXI-compliant interfaces on related MAP-200 chassis variants. Related benchtop and compact configurations support 2 and 3-slot populations.

MPN

MAP+1111110

Brand Name

JDS Uniphase

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