The Keithley 3765 Hall Effect Card is a plug-in measurement module for the 3706A mainframe that enables precise characterization of material magnetic properties through Hall effect testing. The card buffers test signals from Hall samples and switches current from a source to the sample under test, supporting both Van der Pauw and Hall Bar measurement configurations. It delivers Hall voltage sensitivity to 50 nV and can measure sample resistances exceeding 10 TΩ.
Technical Specifications
High Resistivity Mode
• Input voltage range: ±8 V
• Input impedance: >100 TΩ in parallel with <3 pF
• Input bias current: 50 fA at 23 °C (approximately doubles per 10 °C rise)
• Input voltage noise: 10 GΩ in parallel with <420 pF
• Input bias current: <100 pA
• Input voltage noise: <50 nV peak to peak (0.1–10 Hz bandwidth)
• Input-to-output resistance: 1 GΩ in parallel with 150 pF
• Warm-up time: 1 hour
• Operating temperature: 0 °C to 50 °C
• Dimensions: 25.40 mm H × 166.12 mm W × 263.40 mm L
• Weight: 2.27 kg
– Key Features
• Dual-mode architecture optimized for both low and high resistivity samples
• Femtoampere-level input bias current in high resistivity mode
• Sub-50 nV noise floor in low resistivity mode
• Form A switching with four-by-five matrix topology
• Triaxial connectors throughout for low-noise signal routing
– Typical Applications
• Advanced materials research and characterization
• Semiconductor Hall effect measurements
• Quality control testing in material science
• Magnetic property determination of thin films and bulk samples
– Compatibility & Integration
Designed exclusively for the Keithley 3706A mainframe. Works with Keithley DMMs, current sources, and ammeters within the 3706A ecosystem.
