The Keithley 4200-SMU is a precision source-measure unit delivering synchronized DC sourcing and measurement for semiconductor device characterization, materials analysis, and component testing. It combines high-resolution voltage and current sourcing with femtoampere-level measurement sensitivity, supporting both continuous operation and pulsed delivery. Engineers use it for I-V characterization, transient analysis, and automated parameter extraction in R&D and production environments.
Technical Specifications
Sourcing
• Voltage: ±210 V
• Current: ±1 A (pulsed), ±500 mA (continuous)
• Power output: Up to 52.5 W (pulsed)
• Resolution: 100 nV, 100 fA
• Accuracy: Typically 0.1% of reading
Measurement
• Voltage range: ±210 V
• Current range: ±1 A (pulsed), ±500 mA (continuous)
• Resolution: 100 nV, 100 fA with 0.1 fA effective resolution in specific configurations
• Accuracy: Typically 0.05% of reading
• Integration time: Selectable 100 ns to 100 s
– Key Features
• Configurable voltage and current sweeps for device characterization
• High-speed pulse generation for transient analysis
• Femtoampere-level current measurement capability
• Programmable output impedance for load condition simulation
• Advanced triggering for external equipment synchronization
• High channel-to-ground isolation preventing ground loops
– Typical Applications
• Semiconductor device characterization
• Materials and component testing
• Low-current measurement analysis
• Sensitive device development and validation
– Compatibility & Integration
Designed for integration into automated test systems with advanced control via Keithley’s test automation and data acquisition software. Supports synchronization with third-party test and measurement equipment. Form factor accommodates both rack-mount and benchtop configurations depending on module setup.
