The Keithley DMM7512 is a dual-channel 7.5-digit sampling multimeter that integrates two independent DMM modules into a single 1U rack-mount enclosure. It delivers simultaneous measurements across two devices under test, doubling test throughput while maintaining a compact footprint in high-density test systems.
The instrument captures transient signals and waveforms at 1 Msample/sec with 18-bit resolution. Voltage sensitivity reaches 1 µV and current sensitivity 0.1 nA in sampling mode. For DC measurements, resolution extends to 10 nV, 0.1 µΩ, and 1 pA—essential for characterizing low-power components. DC voltage ranges span 100 mV to 1000 V with accuracy from 14 ppm (10 V range) to 41 ppm (1000 V range), all calibrated at TCAL ±5 °C.
## Technical Specifications
**Measurement & Digitization**
• Digitizer: 1 Msample/sec, 18-bit
• DC voltage ranges: 100 mV, 1 V, 10 V, 100 V, 1000 V
• DC voltage resolution: 10 nV minimum
• Voltage sensitivity (sampling): 1 µV
• Current sensitivity (sampling): 0.1 nA
• Reading storage: 27.5 million time-stamped readings per channel
• Input impedance (100 mV–10 V): >10 GΩ || <400 pF (auto) or 10 MΩ ±1%
• Input bias current: <50 pA at 23 °C
**Hardware & Interfaces**
• Channels: 2 independent DMM modules
• Form factor: 1U high, full rack width
• Communications: USB-A (flash drive), USB-B (data/control), Ethernet LAN (LXI 2016 compliant, TCP/IP, IEEE 802.3)
• Digital I/O: For stand-alone binning and component handler interfaces
• Firmware: Upgradeable and downgradeable
## Key Features
• Embedded Test Script Processor (TSP) for direct on-instrument script execution, reducing PC overhead
• TSP-Link support enables master/slave instrument-to-instrument communication
• Simplified trigger model with measure configuration lists
• Built-in comparator for pass/fail limit testing
• No front-panel display; virtual front panel via LAN
• SCPI and TSP programming languages
## Typical Applications
• Multi-device simultaneous characterization in production test
• Transient capture and waveform analysis
• Low-current and low-voltage component validation
• Stand-alone automated test binning operations
## Compatibility & Integration
The DMM7512 integrates into LXI-compliant test systems via Ethernet and supports legacy SCPI control. USB interfaces enable firmware updates and direct PC communication. Digital I/O expands system integration with component handlers and external logic.
