The Keithley Instruments 2611 is a single-channel SourceMeter that combines power supply, current source, voltage source, multimeter, and electronic load functionality into one instrument. Built for precision sourcing and measurement, it delivers 6½-digit resolution with four-quadrant operation—sourcing and sinking both voltage and current across a wide dynamic range. The 2611 excels in benchtop I-V characterization and automated test systems, supported by TSP (Test Script Processing) technology for high-throughput scripting and control.
Technical Specifications
Sourcing Capabilities:
• Voltage source range: ±200 mV to ±200 V across four programmable ranges
• Voltage programming accuracy: 0.02% + 375 µV (200 mV range) to 0.02% + 50 mV (200 V range)
• Current source range: ±100 nA to ±10 A (10 A accessible in pulse mode only)
• Current programming accuracy: 0.06% + 100 pA (100 nA range) to 0.5% + 40 mA (10 A range)
• Maximum output power: 200 W
• Voltage regulation: Line 0.01% of range; Load ±(0.01% of range + 100 µV)
• Current regulation: Line 0.01% of range; Load ±(0.01% of range + 100 pA)
• Transient response time: < 70 µs for 0.1% settling on 10–90% load step
Measurement Capabilities:
• Voltage measurement range: ±200 mV to ±200 V
Operating Characteristics:
• Four-quadrant operation with ±1.515 A @ ±20 V maximum source/sink limits
• Bipolar current limit: minimum 10 nA
• Bipolar voltage limit: minimum 20 mV
• Current source overshoot: < ±(0.1% + 10 mV) typical
– Key Features
• Single-channel design simplifies integration into test benches and automated systems
• 6½-digit resolution enables precise characterization across wide voltage and current ranges
• Four-quadrant sourcing and sinking eliminates external load requirements
• TSP scripting engine allows complex test sequences without external computer
• Tight voltage regulation and fast transient response support dynamic load testing
– Typical Applications
• Semiconductor device characterization (diodes, transistors, power devices)
• Battery and power source evaluation
• Component I-V curve generation
• Electronic load emulation
• Automated production test for discrete and integrated circuits
– Compatibility & Integration
Standalone benchtop operation via front panel or remote control via GPIB, USB, or Ethernet interfaces.
