The Keysight (Agilent) 4280A is a precision 1 MHz C-G meter and C-V plotter engineered for semiconductor device and material characterization. This single instrument consolidates capacitance, conductance, and transient measurement capabilities—eliminating the need for multiple discrete test instruments. The 4280A performs C-V (Capacitance-Voltage) sweeps with programmable DC bias, C-t (Capacitance-Time) transient analysis, and steady-state C-G measurements at constant bias. Its 1 MHz test signal and 0.1% basic measurement accuracy enable rapid, reliable characterization of capacitive networks and semiconductor junctions across wide voltage ranges.
Technical Specifications
Measurement Capabilities
• Test signal: 1 MHz sine wave, 10 mVrms to 30 mVrms
• Functions: Capacitance (C), Conductance (G), C-G simultaneous
• Measurement modes: C (constant bias), C-V (swept bias), C-t (pulsed bias)
• Basic accuracy: 0.1%
• Capacitance range: 0.001 pF to 1.9 µF with 1 fF minimum resolution
• Conductance range: 0.01 µS to 12.000 mS with 10 µS maximum resolution
• Capacitance display: 5½ digits (Option 001)
DC Bias Source
• Output range: 0 V to +100 V
• Setting resolution: 1 mV minimum
• C-V sweep: Single or double staircase with programmable start, stop, and step voltage
• Initial hold time: 3 ms to 650 s
• Step delay time: 3 ms to 650 s
• C-t pulse bias: Internal generator with 10 ms resolution; external synchronization at 10 µs resolution
– Key Features
• Automatic error correction removes cable and fixture residuals
• Zero open adjustment compensates fixture stray capacitance and conductance
• Floating and grounded measurement support
• Programmable DC bias with staircase sweep functionality
• Integrated pulse generator for transient characterization
– Typical Applications
• Semiconductor junction and device capacitance profiling
• Material permittivity and loss-factor measurement
• Schottky barrier and MOS capacitor analysis
• Transient capacitance decay studies
– Compatibility & Integration
HP-IB interface enables integration into automated test systems and external pulse generator synchronization (e.g., HP 8112A).
