The Keysight (Agilent) 87104B is a Single Pole, Four Throw (SP4T) electromechanical coaxial switch engineered for RF and microwave signal routing across DC to 20 GHz. Designed for automated test systems requiring high reliability, the 87104B delivers consistent performance through magnetic latching, terminated ports, and exceptional isolation characteristics. It withstands 10 million operational cycles with guaranteed insertion loss repeatability of 0.03 dB up to 5 million cycles—critical for minimizing recalibration in production and field environments.
Technical Specifications
Frequency Range: DC to 20 GHz
Switch Configuration: Single Pole, Four Throw (SP4T), electromechanical
Electrical Performance
• Maximum withstand voltage: 60 V
• Maximum current capacity: 150 mA
• ON resistance: 2.5 Ω maximum
• OFF resistance: 10 GΩ maximum
• Power rating into internal termination: 1 W CW, 50 W peak (10 µs max pulse, 1 W average limit)
• Power rating into thru path: 2 W CW, 100 W peak (10 µs max pulse, 2 W average limit)
• Isolation: >100 dB DC to 12 GHz; >95 dB at 20 GHz; >90 dB at 26.5 GHz
• VSWR: 1.2 maximum DC to 4 GHz; 1.45 maximum 12.4 to 18 GHz; <1.7 at 20 GHz
Switching Performance
• Maximum switching speed: 15 ms
• Operating life: 10 million cycles (typical)
• Insertion loss repeatability: 0.03 dB (guaranteed to 5 million cycles)
Control & Interface
• Control logic: 24 VDC (Option 024)
• TTL/5V CMOS compatible (optional)
• Opto-electronic indicators and interrupts
– Key Features
• Magnetic latching eliminates hold-up power requirements
• Terminated ports maintain signal integrity on inactive paths
• SMA (f) connectors with solder terminal termination (Option 100)
• Low insertion loss with high port isolation
• Predictable repeatability supports reduced test cycle times
– Environmental Specifications
• Operating temperature: –25 to 75 °C
• Storage temperature: –55 to 85 °C
• Magnetic field emission: <5 gauss at 1/4 inch from surface
• RFI compliance: MIL-STD-461C, RE02, Part 4
– Typical Applications
• Automated RF test and measurement systems
• Multi-channel signal routing in microwave test benches
• Component characterization and network analysis
• Production test of high-frequency devices and assemblies
