The Keysight E5504A Phase Noise Measurement Solution delivers phase noise characterization across 50 kHz to 26.5 GHz, with optional expansion to 110 GHz. This system minimizes ATE test time for VCOs, DROs, crystal oscillators, and synthesizers through measurement sensitivity and speed. The solution integrates a phase noise test set, high-speed VXI digitizer, low-noise frequency downconverters, and automated measurement software. Phase detection with reference source demodulation reduces noise sidebands to baseband, enabling rapid, accurate signal analysis.
Technical Specifications
• Frequency range: 50 kHz to 26.5 GHz
• Expanded carrier frequencies: up to 110 GHz
• Offset range: 0.01 Hz to 100 MHz (standard), with options for 0.01 Hz to 4 MHz, 0.01 Hz to 8 MHz, or 0.01 Hz to 10 MHz
• Measurement techniques: phase detector with reference source method
• Measurement capabilities: phase noise characterization, AM noise direct measurement, one-port device testing
– Key Features
• sensitivity for phase noise measurement
• Fastest measurement speed available in class
• Direct AM noise measurement capability
• Phase detector and phase-lock loop circuitry (integrated test set)
• High-speed VXI digitizer with mainframe for baseband signal analysis
• Low-noise frequency downconverters for optimal performance
• Millimeter-wave support via harmonic mixers (11970 series) and 26.5 GHz microwave downconverter
• 45 dB variable gain IF amplifier option
• Automated measurement software with real-time multi-user viewing
– Typical Applications
• VCO phase noise characterization
• DRO noise testing
• Crystal oscillator evaluation
• Synthesizer phase noise assessment
• ATE system integration for production testing
– Compatibility & Integration
The system integrates with optional signal generators including Keysight 8662A, 8663A, 8643A, 8644B, 8664A/B, and 8665A for low-noise reference signal provision. The measurement software operates on PC platforms and enables client-server architecture for distributed measurement access.
