The Keysight (Agilent) N4417A Balanced Measurement S-parameter Test Set characterizes S-parameters of balanced and differential devices across frequencies starting at 30 kHz. This test set integrates with Keysight network analyzers to deliver multiport S-parameter measurements on devices with up to four ports, enabling precise signal integrity analysis and performance evaluation across RF and microwave applications. The N4417A operates within a larger physical layer measurement system that includes a network analyzer, system controller, and N4425A Balanced Measurement Software (revision 1.24 or later).
Technical Specifications
• Frequency Range: 30 kHz to upper limit set by compatible network analyzer
• Measurement Types: S-parameters (S11, S21, S12, S22) for balanced and differential devices
• Port Configuration: Supports multiport measurements up to four ports
• Calibration: Advanced calibration techniques integrated for improved measurement accuracy
• Accuracy: Designed for high-accuracy S-parameter measurements
– Key Features
• Low-frequency capability from 30 kHz enables characterization of devices requiring sub-100 kHz analysis
• Purpose-built for balanced and differential device measurement, providing direct insight into signal integrity performance
• Compatible with multiple Keysight network analyzer platforms, allowing flexible integration into existing test infrastructure
• Advanced calibration methods ensure consistent measurement precision across diverse device topologies
• Multiport architecture accommodates complex test configurations up to four-port characterization
– Typical Applications
• Balanced and differential circuit characterization
• Low-frequency S-parameter analysis from 30 kHz upward
• Signal integrity evaluation of balanced transmission systems
• Multiport device performance assessment
– Compatibility & Integration
The N4417A functions as a component within a multiport test system paired with a Keysight network analyzer, N4425A Balanced Measurement Software revision 1.24 or later, system controller, and interconnect cabling. This architecture enables integrated S-parameter measurement workflows for balanced-circuit applications across RF and microwave frequency bands.
