The Keysight N6953A is a 1000 W single-output programmable DC power supply engineered for high-performance automated test equipment (ATE) applications. Built on Keysight’s VersaPower architecture, it delivers fast command processing, rapid transient response, and precision measurements to maximize test throughput and system efficiency.
Technical Specifications
Power Output
• Maximum power: 1000 W
• Voltage range: 0 to 60 V DC
• Current range: 0 to 16.7 A DC
• Input voltage: 240 VAC
Precision & Resolution
• Programming resolution: 14 bits (voltage/current)
• Measurement resolution: 18 bits (voltage/current)
• Residual ripple: < 9 mVpp
• Command processing speed: < 2 ms
• Transient settling time: 100 µs
• Voltage/current programming speed: 3 ms (up/down)
Physical Specifications
• Form factor: 1U rack mount
• Dimensions: 426.9 mm W × 44.45 mm H × 568.7 mm D
• Weight: 10.9 kg
– Key Features
Dual Measurement System: Provides simultaneous voltage and current measurement with DMM-grade accuracy. Advanced power metrics include peak power, watt-hour, and amp-hour calculations.
Operating Modes: Standard operation supports up to 10% of rated current in negative output. Full two-quadrant (source and sink) capability available with optional N7909A power dissipater unit. Parallel operation supported with other N6900 series supplies, enabling configurations up to 10 kW with equal current sharing.
Programmable Enhancement Options:
• Option 301: Accuracy package improving programming and measurement precision with seamless dual current range
• Option 302: External data logging and voltage/current digitizers with programmable sample rates
• Option 303: Arbitrary waveforms, output list capability, and enhanced up/down programming speeds
• Options 760 & 761: Output disconnect and polarity-reversal relays for DUT protection
– Interfaces
GPIB (IEEE-488), LAN (LXI-Core), and USB connectivity enable integration into diverse test platforms.
– Typical Applications
Automated test equipment, device characterization, power conversion testing, and semiconductor validation requiring fast command response and high measurement resolution.
