The LeCroy SDA-820ZI-A is a high-performance digital oscilloscope engineered for advanced serial data analysis and signal integrity validation. It delivers up to 20 GHz bandwidth across four channels, with Digital Bandwidth Interleaving (DBI) technology enabling higher single-channel performance up to 45 GHz. This platform excels at jitter characterization, compliance testing, and complex serial data stream debugging through its exceptional noise floor of 125 fsrms and sampling rates reaching 120 GS/s on single channels.
Technical Specifications
Bandwidth & Sampling
• 4 channels at 20 GHz; 2 channels at 30 GHz; 1 channel at 45 GHz (with DBI)
• Sample rates: 40 GS/s (4 channels), 80 GS/s (2 channels), 120 GS/s (1 channel at 45 GHz)
• Bandwidth upgrade range: 4 GHz to 45 GHz
• Acquisition memory: 20 Mpts/channel standard; up to 256 Mpts/channel optional; 512–768 Mpts/channel with DBI
Jitter & Timing Performance
• Jitter noise floor: 125 fsrms (45 GHz); <190 fsrms (20 GHz)
• Timebase jitter: <500 fs typical
• Trigger and interpolator jitter: 1 ps rms typical; <0.1 ps rms with software assistance
• Timebase accuracy: <1 ppm + 0.5 ppm/yr aging
• Time interval accuracy: <0.06/SR + (clock accuracy × Reading) rms
Vertical System
• Resolution: 8 bits; up to 11 bits with Enhanced Resolution (ERES)
• DC vertical gain accuracy: ±1% F.S. typical; ±1.5% F.S. test limit
• Sensitivity: 2 mV–1 V/div (50 Ω); 2 mV–10 V/div (1 MΩ), fully variable
• Offset range: ±500 mV to ±100 V depending on impedance and setting
Horizontal System
• Time/division: 5 ps/div–320 s/div (real-time: 5 ps/div–20 s/div)
• Intersegment time: 1 µs
• Channel-channel isolation: 50 dB (DC–10 GHz), 46 dB (10–15 GHz), 40 dB (15–20 GHz)
Triggering & Acquisition
• Hardware serial trigger: up to 14.1 Gb/s (standard 6.5 Gb/s, upgradeable)
• Maximum trigger rate: 1,000,000 waveforms/second (Sequence Mode, up to 4 channels)
– Key Features
• 15.3″ widescreen WXGA color touch screen display
• ProBus and ProLink probe interfaces
• Integrated 50 Ω and 1 MΩ inputs
• Ethernet and IEEE 488.2 (GPIB) connectivity
• X-Stream II streaming processor architecture
• Second-generation chipsets deliver 25% improved noise performance
– Typical Applications
• Serial data compliance testing and validation
• High-speed signal integrity analysis
• Jitter and timing characterization
• Complex digital design debugging
– Compatibility & Integration
The instrument supports ProBus and ProLink probe ecosystems with dual input impedance (50 Ω and 1 MΩ) configurations. Network connectivity via Ethernet and GPIB enables remote control and data transfer in automated test environments.
