The Nanometrics/Accent Optical Technologies DiVA D225 is a dual-channel synchronous pulse source measurement unit for dynamic and static characterization of semiconductor devices. It performs pulsed I(V) measurements from a quiescent bias point with pulse widths as short as 100 ns, alongside conventional DC I(V) analysis. The instrument supports Bipolar, HBT (NPN), FET, HEMT, and diode characterization in a compact single-box configuration with Windows-based control.
Technical Specifications
• Measurement Modes: Dynamic (pulsed) I(V) and static (DC) I(V)
• Pulse Width Range: 100 ns to 1 ms
• Channels: Dual-channel synchronous pulse source measurement unit
• Drain/Collector Channel Output Voltage: Up to +25 V
• Drain/Collector Channel Maximum Current: 1 A
• Gate/Base Port: Supports positive and negative current drive or voltage drive
• Supported Device Types: Bipolar, HBT (NPN), FETs, HEMTs, Diodes
– Key Features
• High-speed pulsed I(V) measurement down to 100 ns
• DC I(V) measurement on identical channels as pulsed operation
• Iso-thermal and iso-dynamic data analysis modes
• Controlled compliance for precise parameter control
• Third-party program control for automated test integration
• Batch mode execution for multiple test sequences
• I(V) parameter fitting for HEMT and FET models
• Common data format support
• Stable measurement environment
• Short transient measurement capability
– Typical Applications
• Research and development of semiconductor devices
• Quality control and device validation
• High-throughput characterization workflows
– Compatibility & Integration
The DiVA D225 integrates into automated test systems through third-party program control via standard communication protocols. Data exchange with external analysis tools is supported through common data format compatibility.
