The Nanometrics / Accent Optical Technologies DiVA D265 Dynamic I(V) Analyzer is a semiconductor device characterization instrument that performs high-speed pulsed and DC current-voltage measurements. The system executes dynamic I(V) analysis with pulse widths from 200ns to 1ms, effectively isolating device behavior from self-heating and charge-trapping effects. A dual-channel synchronous pulse source measurement unit enables simultaneous characterization of multiple device terminals, delivering iso-thermal and iso-dynamic data acquisition within a stable measurement environment.
Technical Specifications
• Drain/Collector channel: +65V output, 2A maximum current
• Gate/Base port: Positive and negative current or voltage drive
• Pulse width range: 200ns to 1ms
• Measurement modes: Pulsed (dynamic) and DC (static) I(V)
• Device compatibility: FETs, HEMTs, NPN bipolar transistors, HBTs, and diodes
• Shipping weight: ~50 lbs
– Key Features
• Dual-channel synchronous pulse source measurement configuration
• Controlled compliance settings for precise measurement control
• High-resolution measurement mode with optimized pulse width and connection considerations
• I(V) parameter fitting for HEMT and FET models
• Windows-based graphical user interface
• Batch mode operation for automated measurement sequences
• Compact single-box integration
– Typical Applications
• Production and laboratory semiconductor device characterization
• High-frequency device analysis under dynamic conditions
• Parametric extraction for model validation
• Transient measurement in stable thermal environments
– Compatibility & Integration
The DiVA D265 integrates with external automation and control systems through third-party software interfaces. Standard data format support facilitates analysis workflows with complementary metrology and simulation tools.
