The National Instruments PXI-5412 is a 14-bit arbitrary waveform generator delivering high-performance signal synthesis for automated test systems. Operating at 100 MS/s base sampling rate, it reaches 400 MS/s with software-selectable digital interpolation. The single-channel module provides 20 MHz analog bandwidth and generates arbitrary waveforms, standard functions (sine, square, triangle, ramp), and function generator emulation modes across a full-scale voltage range of 12.00 Vpk-pk down to 5.64 mVpk-pk into 50 Ω loads.
Technical Specifications
• Form Factor: PXI module (1-slot, 3U) or PCI board
• DAC Resolution: 14 bits
• Sampling Rate: 100 MS/s base; 400 MS/s with interpolation
• Analog Bandwidth: 20 MHz
• Onboard Memory: 8 MB, 32 MB, or 256 MB (configurable by part number)
• Data Transfer Rate (PCI): Up to 84 MB/s
• Output Connector: SMB jack
• Maximum Output Voltage (high-gain amplifier): ±6.000 Vpk into 50 Ω; ±11.43 Vpk into 1 kΩ; ±12.00 Vpk open load
• Maximum Output Voltage (low-gain amplifier): ±1.000 Vpk into 50 Ω; ±1.905 Vpk into 1 kΩ; ±2.000 Vpk open load
• DC Accuracy: ±0.2% of amplitude range ± 0.05% of offset ± 500 µV (typical)
• AC Amplitude Accuracy (50 kHz sine, high impedance): +0.8% + 0.5 mV to -0.2% – 0.5 mV (typical)
• General Amplitude/Offset Accuracy (0 °C to 55 °C): ±0.4% of amplitude range ± 0.05% of offset ± 1 mV
– Key Features
• Software-selectable FIR digital interpolation with factors of 2, 4, or 8 for image relocation and signal quality improvement
• Synchronization and Memory Core (SMC) technology for waveform sequencing, looping, and multi-module synchronization
• Advanced triggering modes: single, continuous, burst, and stepped
• Dual output gain paths (low-gain and high-gain amplifiers) for flexible voltage level adaptation
– Typical Applications
Mixed-signal test systems, device characterization, arbitrary waveform synthesis, and coordinated multi-instrument measurements requiring synchronized signal generation.
– Compatibility & Integration
Integrates with PXI chassis and PCI-based test platforms. SMC technology enables synchronization across multiple National Instruments modules for complex test scenarios.
