The NI PXI-5412 is a high-performance arbitrary waveform generator module designed for PXI chassis integration. It delivers user-defined and standard waveforms—sine, square, triangle, and ramp—with 14-bit resolution across a 20 MHz analog bandwidth. Native sampling reaches 100 MS/s; digital interpolation extends effective rates to 400 MS/s for smooth waveform generation. Dual amplifier paths provide flexible output levels from ±1.000 V pk to ±12.00 V pk depending on load impedance and gain selection.
Technical Specifications
Signal Generation
• Arbitrary waveforms plus standard function generation
• Native sampling rate: 100 MS/s
• Interpolated sampling rate: 400 MS/s (interpolation factors 2, 4, or 8)
• Resolution: 14 bits
• Analog bandwidth: 20 MHz
• Frequency range: 0 µHz to 20 MHz
• Output voltage (50 Ω load): 12.00 V pk-pk (main path); ±6.000 V pk (high-gain); ±1.000 V pk (low-gain)
• Amplitude accuracy: ±1% of full scale (main path); ±0.4% of range ± 0.05% offset ± 1 mV (0–55 °C)
• Phase accuracy: ±1 degree at 1 kHz
• Waveform interpolation with selectable disable for sharp edges and fast rise/fall times
Memory
• Onboard options: 8 MB, 32 MB, or 256 MB
• Shared waveform and instruction memory
• Flexible sequence lists and user-defined parameter allocation
• Waveform size in multiples of four samples
Synchronization and Triggering
• Multi-module sync with <20 ps rms skew via TClk
• External sample clock input via CLK IN connector
• Phase-lock to external reference or 10 MHz PXI reference
• Divide-by-N and High-Resolution sample clock modes
• Integration with digitizers and digital generators for mixed-signal test systems
– Key Features
• Phase-coherent multi-channel operation through synchronized module arrays
• Independent amplifier paths for high and low signal levels
• Interpolation disable for applications requiring minimal waveform filtering
• Flexible memory architecture supporting variable sequence complexity
– Typical Applications
• Communications signal generation and validation
• Aerospace and defense test scenarios
• Multi-instrument synchronization in mixed-signal environments
– Compatibility & Integration
Designed for PXI modular architecture. Synchronizes with NI digitizers and digital generators via TClk and PXI trigger buses.
