The Programmed Test Sources (PTS) 500 is a direct-synthesis frequency synthesizer engineered for precision signal generation across 1 MHz to 499.999 999 9 MHz. It delivers stable, low-noise signals with switchable phase-continuous output and programmable control via BCD, GPIB, or manual dial. Built for research, development, and automated test systems requiring fast frequency switching and minimal spurious content.
Technical Specifications
Frequency
• Range: 1 MHz to 499.999 999 9 MHz
• Resolution: 0.1 Hz to 100 kHz (optional decade steps); DDS option: 0.1 Hz minimum (0.2 Hz above 250 MHz)
• Accuracy: Traceable to internal or external 5.0 or 10.0 MHz standard
– OCXO: 3 × 10⁻⁹/day, ±1 × 10⁻⁸ (0–50°C), 1 × 10⁻⁸/year
– TCXO: 1 × 10⁻⁸/day, ±1 × 10⁻⁸ (0–50°C), 2 × 10⁻⁸/year
Output
• Level: +3 dBm to +13 dBm (1 V max into 50 Ω), remotely adjustable
• Flatness: ±0.5 dB
• Impedance: 50 Ω
• Harmonics: −30 dBc (full output), −40 dBc (reduced levels)
• Phase Noise: −63 dBc (0.5 Hz–15 kHz offset); −100 dBc/Hz @ 100 Hz, −110 dBc/Hz @ 1 kHz, −120 dBc/Hz @ 10 kHz, −125 dBc/Hz @ 100 kHz
• Noise Floor: −135 dBc/Hz
• Spurious Outputs: −70 dBc discrete (−55 dBc at f/2 and 3f/2 above 250 MHz); DDS-TLU option: −60 dBc or −70 dBc phase-continuous
Switching
• Time: 20 µs (100 MHz–10 MHz digit), 5 µs (1 MHz–0.1 Hz digit); <1 µs transient with DDS-TLU option
• Type: Phase-continuous switching available with DDS options
Control
• Manual: 10-position dial
• Remote: TTL BCD parallel, GPIB (IEEE 488.1 or 488.2/SCPI optional), analog voltage for output level
Power
• Input: 105–125 V, 50–400 Hz, 50 W (100 V, 220 V, 240 V optional)
– Key Features
• Direct synthesis architecture with beat-frequency system
• Phase-continuous switching for coherent test sequences
• Output level adjustable manually or remotely via analog control
• Frequency doubling for 250–500 MHz band
• Low discrete and broadband spurious content across full range
– Typical Applications
• Component and subsystem characterization
• Automated test equipment (ATE) signal sourcing
• Phase-locked loop and receiver testing
• Standards and calibration work
– Compatibility & Integration
Parallel BCD entry supports legacy systems. Optional GPIB interfaces legacy (488.1) and modern (488.2/SCPI) test platforms. Analog control input enables integration with external level-setting networks.
