The Tektronix TDS8000 Digital Sampling Oscilloscope delivers high-performance signal analysis for advanced engineering applications. This modular instrument supports flexible configurations through interchangeable electrical and optical sampling modules, enabling bandwidth up to 50 GHz. Equipped with exceptional timing resolution down to 10 femtoseconds and trigger jitter as low as 1.0 ps, the TDS8000 excels in semiconductor testing, high-speed digital communications, and Time-Domain Reflectometry measurements. The Windows-based interface provides intuitive waveform acquisition and analysis capabilities.
Technical Specifications
Signal Acquisition
• Acquisition modes: Sample, envelope, and average
• Record length: 20, 50, 100, 250, 500, 1000, 2000, or 4000 samples
• Sample interval: Down to 10 femtoseconds
Bandwidth and Rise Time
• Bandwidth: DC to 50 GHz (module-dependent)
• TDR system rise time: < 35 ps (80E04 module)
Horizontal System
• Timebase range: 1 ps/div to 5 ms/div (main and magnification views)
• Equivalent-time sweep speeds: 0.5 ps/div to 5 ms/div
• Horizontal sensitivity: 1 ps + 1% of interval ( 21 ps, optimized mode); 8 ps + 0.01% of interval (locked to 10 MHz mode)
• Horizontal deskew range: -500 ps to +100 ns per channel (1 ps increments)
Trigger System
• Trigger sources: External direct, clock recovery (optical modules), pre-scaled input
• External direct trigger sensitivity: 50 mV (DC–4 GHz typical), 100 mV (DC–3 GHz guaranteed)
• Pre-scaled trigger sensitivity: 800 mV (2–3 GHz); 600 mV (3–10 GHz); 1000 mV (10–12.5 GHz typical)
• Trigger level range: ±1.0 V
• Trigger input range: ±1.5 V
• Trigger holdoff: 5 µs to 100 ms (2 ns increments)
• Trigger jitter: 1.0 ps + 5 PPM of position (typical, short-term optimized); 1.6 ps + 0.05 PPM of position (typical, locked to 10 MHz reference)
Time-Domain Reflectometry
• TDR channels: 2 per 80E04 module
• TDR amplitude: 250 mV
• TDR system rise time: < 35 ps
• Time coincidence between TDR steps: < 1 ps
• Source resistance: 50 Ω
– Key Features
• Modular architecture supporting multiple electrical and optical sampling modules
• High-resolution vertical measurement with repeatability across configurations
• Adjustable horizontal deskew for precise multi-channel alignment
• Dual-mode trigger jitter optimization for timing-critical applications
– Typical Applications
• Semiconductor device characterization and testing
• High-speed digital signal integrity analysis
• Impedance profiling via Time-Domain Reflectometry
• Optical signal measurement and recovery
– Compatibility & Integration
The TDS8000 accommodates 80E04 TDR modules and supports optical sampling modules for clock recovery triggering. External trigger inputs accept signals up to ±1.5 V with configurable sensitivity across DC to 12.5 GHz.
