The Rohde & Schwarz FSEA30-B2 is a high-performance spectrum analyzer spanning 20 Hz to 7 GHz, engineered for precision signal analysis in demanding R&D, manufacturing, and laboratory environments. Option B2 integrates advanced vector signal analysis capabilities, delivering superior spectral purity, fast measurement refresh rates, and low noise floor performance across its full frequency range.
Technical Specifications
Frequency Performance
• Frequency range: 20 Hz to 7 GHz
• Frequency resolution: 0.01 Hz
• Internal reference frequency aging: 1 × 10⁻⁹ per day, 2 × 10⁻⁷ per year
• Internal reference frequency temperature drift (0°C to +50°C): 5 × 10⁻⁸
• Total internal reference frequency error limit: 2.5 × 10⁻⁷ per year
• External reference: 10 MHz or n × 1 MHz (n = 1 to 16)
• Frequency counter resolution: 0.1 Hz to 10 kHz (selectable)
Spectral Purity
• SSB phase noise at 1 kHz offset: <–107 dBc(Hz) (f ≤ 500 MHz), 500 MHz)
• SSB phase noise at 10 kHz offset: <–120 dBc(Hz) (f ≤ 500 MHz), 500 MHz)
• SSB phase noise at 1 MHz offset: <–138 dBc(Hz) (f ≤ 500 MHz), 500 MHz)
Measurement Performance
• Displayed average noise level: typically –150 dBm (10 Hz bandwidth)
• Displayed noise floor: typically –159 dBm
• 1 dB compression point: +10 dBm
• 3rd-order intercept point: +20 dBm typical
• 2nd harmonic intercept point: >25 dBm (f 40 dBm (f > 150 MHz)
• Total level measurement uncertainty (up to 1 GHz): 20 updates/s (1 trace), >15 updates/s (2 traces)
• Full span sweep time: 5 ms
• Sampling rate: 50 ns (20 MHz A/D converter)
• Number of pixels: 500
– Key Features
• Ultra-low phase noise architecture for spectral purity analysis
• Configurable sweep timing from microseconds to hours
• Wide dynamic range with sub-dBm noise performance
• Dual-trace real-time display capability at >15 Hz refresh
• Precision frequency counting with 0.1 Hz resolution
• Vector signal analysis via Option B2
– Typical Applications
• Signal characterization in RF/microwave development
• Component and subsystem testing
• Interference identification and measurement
• Phase noise and spectral purity assessment
• Frequency counter and marker-based analysis
