The Rohde & Schwarz AMIQ04 is a dual-channel I/Q modulation generator designed for precise baseband and intermediate frequency signal generation up to 25 MHz. It functions as a 2-channel arbitrary waveform generator with deep sample memory, supporting complex modulated signal creation across communications, aerospace, and defense applications. The instrument operates standalone via R&S WinIQSIM™ software or integrated with R&S SMIQ series signal generators, delivering the signal complexity and fidelity required for advanced modulation validation and RF testing.
Technical Specifications
• Sample rate: up to 100 MSamples/s
• Analog output amplitude resolution: 14-bit
• Digital I/Q output resolution: up to 16-bit (optional, with AMIQ-B3)
• Maximum IF signal generation: 25 MHz
• Memory depth per channel: 16,000,000 samples
• Dynamic range: 78 dB typical (3GPP FDD)
• Adjacent Channel Power (ACP) performance: excellent
– Key Features
• Dual-channel I/Q baseband and IF signal generation
• Arbitrary waveform generation with large sample buffer capacity
• Modulation support: PSK (BPSK, QPSK, offset QPSK, π/4 DQPSK, 8PSK, 8PSK-EDGE), QAM (16/32/64/256), FSK (MSK, 2FSK, 4FSK, GTFM), and user-defined formats
• Signal types: single-carrier, multi-carrier, CDMA, WCDMA (3GPP), HiperLAN2, IEEE 802.11a
• Automatic amplitude and offset alignment with fine skew adjustment for optimal channel symmetry
• Integrated hard disk and floppy disk drives for waveform storage
• Impairment simulation: I/Q imbalance, phase noise, bandpass filtering, amplifier effects
• Full remote control via GPIB/IEEE 488 and RS-232-C interfaces
– Typical Applications
• Digital modulation validation and characterization
• TDMA frame configuration testing
• Multicarrier signal generation and analysis
• RF receiver and transceiver testing
– Compatibility & Integration
Operated via R&S WinIQSIM™ software or directly from R&S SMIQ series signal generators. Waveforms load from integrated storage or via IEC/IEEE bus and RS-232-C. Full programmability enables integration into automated test systems.
