The Santec MLS-8000 is a rack-mountable mainframe designed to house and control up to eight optical light source modules, such as the ECL-200 and ECL-210 series. It provides a stable, low-noise power source and integrated control platform for multi-channel optical testing and measurement applications. The unit features dual communication interfaces—GPIB and RS-232C—enabling external instrument control and system integration. A dedicated communication CPU board manages all installed light source modules. The 19-inch rack-mountable chassis weighs approximately 20 kg and incorporates switchable power voltage selection via rear panel rotary switch. A key-lock power activation mechanism and front panel handles provide operational control. Each module slot supports independent wavelength adjustment through 10-turn potentiometers or dials, with dedicated status indicators for ACC/APC modes and LD activation states.
Technical Specifications
• Chassis capacity: Up to 8 optical light source module slots
• Supported modules: Santec ECL-200, ECL-210 series
• Power source: Low-noise, switchable voltage via rear panel rotary switch
• Physical form factor: 19-inch rack-mountable
• Weight: Approximately 20 kg
• Rear clearance requirement: Greater than 5 cm for heat dissipation
• Recommended installation: Vibration-proof base
• Power input: 3-line cord with protective ground
– Key Features
• Dual communication protocols: GPIB and RS-232C
• Communication CPU board for external control
• Independent wavelength adjustment per module via 10-turn potentiometers
• Front panel ACC/APC mode and LD activation status indicators
• Key-lock power activation
• Switchable power voltage selection
– Typical Applications
• Multi-wavelength optical testing systems
• Fiber optic component characterization
• Optical network validation and troubleshooting
• Laboratory-scale photonics research
– Compatibility & Integration
The MLS-8000 integrates with Santec ECL-200 and ECL-210 series light source modules. External control via GPIB and RS-232C enables integration into automated test systems and measurement platforms.
