The Scientific Test 6010 measures DC and AC magnetic fields with detachable Hall probes, delivering flux density readings in gauss, tesla, or ampere per meter. This portable instrument covers 0.1 µT to 29.99 T (0.001 G to 299.9 kG), with ±1% accuracy plus 5 mV uncertainty in DC mode. Three selectable ranges with automatic range selection optimize measurement precision across diverse field strengths. The large dual-readout display shows flux density alongside auxiliary functions such as temperature or peak/max/min hold values. Battery operation enables field work; line voltage charging supports laboratory use. IEEE-488.2 and SCPI-1991 compliance integrates the instrument into automated test systems.
Technical Specifications
• Measurement capability: DC and AC magnetic fields
• Units: Gauss, tesla, ampere per meter
• Measurement range: 0.1 µT to 29.99 T (0.001 G to 299.9 kG)
• Accuracy: ±1% of reading, ±5 mV (DC mode)
• Selectable ranges: Three manual ranges plus automatic selection
• Display: Large format with dual readout (flux density + auxiliary function)
• Power: Line voltage operation with rechargeable battery for portable use
• Interface: IEEE-488.2 and SCPI-1991 compliant
– Key Features
• Accepts detachable Hall probes for flexible measurement geometry
• Peak, max, and min hold functions for transient field capture
• Automatic range selection based on instantaneous flux density
• Portable design with integral rechargeable battery
• Ruggedized carrying case for probe and accessory protection
– Typical Applications
• Magnet characterization, including multi-pole assemblies
• Magnetic flux density mapping in armatures, stators, transformer laminations, toroidal cores, coils, and solenoids
• Electromagnetic interference source identification
• Weld joint flaw detection via magnetic field anomalies
• Ferrous material inspection
• 3-dimensional field mapping
• Diagnostic equipment integration
– Compatibility & Integration
• IEEE-488.2 and SCPI-1991 protocol support for automated test system integration
• Hall probe architecture enables interchangeable sensors for application-specific measurement ranges
• Careful probe handling required; stem bending or tip pressure may degrade sensor performance
