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Stanford Research SR720 – LCR Meter

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The Stanford Research SR720 LCR Meter is a precision instrument for measuring inductance (L), capacitance (C), and resistance (R) of electronic components and circuits. It offers a wide frequency range, high accuracy, and various measurement modes to suit diverse testing needs. Ideal for component evaluation, quality control, and circuit analysis.

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Equipment info

The Stanford Research SR720 LCR Meter measures inductance, capacitance, and resistance with 0.05% basic accuracy across five discrete test frequencies. This benchtop instrument delivers up to 20 measurements per second and supports multiple measurement modes—Auto, R+Q, L+Q, C+D, and C+R—with selectable series or parallel equivalent circuit models. A 5-digit LED display presents value, deviation, percentage deviation, or bin number. The meter stores 9 complete setups in non-volatile memory and includes open and short circuit calibration compensation. Internal 2.0 VDC ±2% bias or external bias to +40 VDC enables testing under specified bias conditions. Binning functionality supports pass/fail, overlapping, and sequential schemes across up to 8 pass bins plus QDR and general fail categories.

Technical Specifications

• Basic Accuracy: 0.05%
• Display: 5-digit LED (value, deviation, % deviation, or bin number)
• Measurement Modes: Auto, R+Q, L+Q, C+D, C+R
• Equivalent Circuit Models: Series or Parallel
• Measurement Rate: Up to 20 measurements/second (1 kHz and above); 0.6–6 measurements/second (100 Hz, 120 Hz)
• Averaging: 2 to 10 measurements
• Ranging: Auto or Manual
• Triggering: Continuous, Manual, or Remote (RS-232, GPIB, Handler Interface)
• Stored Setups: 9 complete instrument configurations
• Calibration: Open and Short Circuit Compensation

– Measurement Ranges

• Resistance: 0.0001 Ω to 2000 MΩ
• Inductance: 0.0001 µH to 99999 H
• Capacitance: 0.0001 pF to 99999 µF
• Q Factor: 0.00001 to 50
• Dissipation Factor (D): 0.00001 to 10

– Key Features

• Test Frequencies: 100 Hz, 120 Hz, 1 kHz, 10 kHz, 100 kHz (±100 ppm accuracy)
• Drive Voltage: Preset levels 0.1 Vrms, 0.25 Vrms, 1.0 Vrms; vernier adjustment 0.1–1.0 Vrms in 50 mV increments (±2% accuracy)
• Internal Bias: 2.0 VDC ±2%
• External Bias: 0 to +40 VDC with 0.25 A fused output protection
• Binning Schemes: Pass/Fail, Overlapping, Sequential (up to 8 pass bins, QDR, general fail bins)
• Self-Test: ROM, CPU, Non-Volatile RAM, Clock Generator, A/D Converter, Internal Bias, Multiplier, Output Drive, Gain Circuitry, Source Resistances
• Dimensions: 343 mm (W) × 102 mm (H) × 356 mm (D); 4.55 kg
• Operating Temperature: 0 °C to 35 °C
• Warm-up Time: Minimum 30 minutes

– Compatibility & Integration

• Standard Interface: RS-232
• Optional Interfaces: GPIB and Parts Handler Interface
• Handler Output: Bin-data available, busy, and 10 separate bin lines (open collector logic, DB25 male connector)

MPN

SR720

Frequency Range

1 kHz, 10 kHz, 100 Hz, 100 kHz, 120 Hz

Voltage / Current Range

0.1–1.0 Vrms drive; 0–40 VDC external bias; 0.25 A fused output

Brand Name

Stanford Research

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