The Stanford Research SR760 is a single-channel, 100 kHz FFT spectrum analyzer built for high-performance signal analysis in acoustics, vibration, noise measurement, and electronic testing. Its dual 24-bit DSP architecture and 16-bit A/D converter enable real-time processing across the full 100 kHz bandwidth without dead time, cutting measurement durations significantly. The instrument delivers 90 dB dynamic range, allowing observation of signals as low as -114 dBc with averaging, while maintaining low front-end noise and harmonic distortion.
Technical Specifications
Frequency Range & Resolution
• Measurement range: 476 µHz to 100 kHz
• Spans: 191 mHz to 100 kHz (binary sequence)
• Center frequency: 0 to 100 kHz
• Frequency accuracy: 25 ppm (20 °C to 40 °C)
• Resolution: Span/400
• Real-time bandwidth: 100 kHz
Amplitude & Dynamic Range
• Input range: -60 dBV (1.0 mVp) to +34 dBV (50 Vp) in 2 dB steps
• Dynamic range: 90 dB typical
• Harmonic distortion: ≤ -80 dB (DC to 100 kHz, 0 dBV input)
• Noise: 5 nVrms/√Hz typical at 1 kHz; 10 nVrms/√Hz maximum
• Spurious responses: ≤ -85 dB below full scale below 200 Hz; ≤ -90 dB below full scale to 100 kHz
• Amplitude accuracy: ±0.3 dB ±0.02% of full scale (excluding windowing)
Input Specifications
• A/D conversion: 16-bit at 256 kHz sampling
• Coupling: AC or DC
• Input impedance: 1 MΩ, 15 pF
• CMRR at 1 kHz: 90 dB (input < -6 dBV); 80 dB (input < 14 dBV); 50 dB (input ≥ 14 dBV)
– Key Features
• Four window functions: Blackman-Harris, Hanning, Flat-Top, Uniform
• Display modes: Real, imaginary, magnitude, phase spectrum; power spectral density; time records; 1/3 octave spectra
• Analysis: Harmonic analysis, band analysis, sideband analysis, total harmonic distortion, trace math
• Harmonic marker displays up to 400 harmonics
• RMS averaging for true signal and noise estimation
• On-screen frequency markers and limit tables (up to 100 user-defined segments)
• Data tables with 200-point capacity
– Typical Applications
Acoustics, vibration measurement, noise characterization, and general electronic signal testing.
