The Tektronix MSO2024B is a mixed-signal oscilloscope that combines analog and digital signal acquisition for debugging and analysis of complex electronic designs. This instrument simultaneously captures both analog and digital signals, enabling time-correlated observation across 4 analog channels and 16 digital channels. With 200 MHz analog bandwidth, 1 GS/s maximum sample rate, and 1 Mpoint record length, the MSO2024B delivers the performance required for detailed signal investigation in mixed-signal environments.
Technical Specifications
Analog Channels
• 4 channels with 200 MHz bandwidth (-3 dB)
• Input sensitivity: 2 mV/div to 5 V/div
• Maximum input voltage: 300 V (DC + peak AC) or 300 Vrms with peaks 100:1 at <200 MHz
• Calculated rise time: 2.1 ns
• Vertical resolution: 8 bits
Digital Channels
• 16 channels with configurable thresholds: TTL, CMOS, ECL, PECL, or user-defined (±20 V)
• Maximum input voltage: ±40 V
• Threshold accuracy: ±(100 mV + 3% of setting)
• Minimum voltage swing: 500 mV pk-pk
• Input impedance: 101 kΩ with 8 pF probe loading
• Maximum input dynamic range: 80 Vpk-pk (threshold dependent)
• Minimum detectable pulse width: 5 ns
Horizontal System
• Sample rate: 1 GS/s (D7-D0 channels); 500 MS/s (D15-D8 channels)
• Record length: 1 Mpoint maximum
• Maximum capture duration: 1 ms at full sample rate
• Time-base range: 2 ns/div to 100 s/div
• Time-base accuracy: ±25 ppm
• Channel-to-channel deskew: ±100 ns
– Key Features
• Wave Inspector and FilterVu advanced analysis tools for signal exploration and noise reduction
• TekVPI probe interface supporting active, differential, and current probes with automatic scaling
• Hardware bandwidth limit option at 20 MHz
• Input coupling options: AC, DC, GND
– Typical Applications
Mixed-signal circuit debugging, embedded system analysis, signal integrity measurement, digital-to-analog signal correlation.
– Compatibility & Integration
TekVPI probe interface enables broad probe coverage including active, differential, and current measurement probes with automatic probe scaling.
