The Teledyne LeCroy T3AFG30 is a dual-channel arbitrary/function generator delivering 30 MHz bandwidth and 150 MS/s sampling rate for high-fidelity signal generation across electronics testing, circuit validation, and complex waveform applications. The 14-bit vertical resolution and low-jitter architecture ensure precise edge stability and repeatable measurements. With 16 kpts memory per channel and frequency resolution down to 1 µHz, the instrument handles both standard and custom waveforms with exceptional granularity.
Technical Specifications
• Bandwidth: 30 MHz
• Channels: 2
• Sampling Rate: 150 MS/s
• Vertical Resolution: 14-bit
• Memory Depth: 16 kpts per channel
• Output Amplitude: Up to 20 Vpp (≤10 MHz); 10 Vpp (>20 MHz) into high impedance load
• Output Impedance: 100 Ω
• Frequency Resolution: 1 µHz
• Dynamic Range: 80 dB
• Rise/Fall Time: 16.8 ns to 22.4 seconds, independently adjustable
• Power Consumption: 21 W typical; 50 W maximum
• Power Input: 100–240 V (±10%) at 50/60 Hz; 100–120 V (±10%) at 400 Hz
– Key Features
• Function Generation: Sine, square, ramp, pulse, and noise waveforms
• Arbitrary Waveforms: 196 built-in waveforms plus user-defined storage and recall
• Proprietary Arbitrary & Pulse Techniques: Optimized generation beyond traditional DDS limitations
• Modulation Support: AM, DSB-AM, FM, PM, FSK, ASK, PWM, PSK, linear/log sweep, and burst modes (N-cycle and gated)
• Harmonic Function: Available
• Frequency Counter: DC/AC coupled, 100 mHz to 200 MHz range
– Interfaces & Connectivity
• USB Host and USBTMC Device
• LAN (Ethernet) with VXI-11
• 10 MHz Reference Input/Output
• External Modulation, Trigger, Gate, and Counter Inputs
• Auxiliary Output (trigger pulse from internal source)
– Typical Applications
Circuit design validation, component characterization, protocol signal generation, RF subsystem testing, and educational electronics laboratories requiring flexible, programmable waveform generation.
