The Wayne Kerr A40100 is a precision impedance analyzer for accurate measurement of electronic components and materials across a broad frequency spectrum. It delivers basic measurement accuracy of ±0.05% for capacitance, inductance, and impedance, with dissipation factor accuracy of ±0.0005. The instrument measures 11 distinct parameters—impedance, resistance, reactance, phase angle, capacitance, inductance, quality factor, dissipation factor, admittance, conductance, and susceptance—enabling comprehensive characterization in research, development, and quality control workflows.
Technical Specifications
Measurement Frequency Range: 20 Hz to 3 MHz with 42 selectable frequencies per decade (repeating to 60 kHz, with additional steps to 300 kHz). Frequency accuracy: ±0.01%.
Measurement Parameters & Ranges:
• Impedance (Z), Resistance (R), Reactance (X): 0.01 mΩ to >1 GΩ
• Capacitance (C): 0.01 pF to >1 F
• Inductance (L): 1 nH to >2 kH
• Quality Factor (Q), Dissipation Factor (D): 0.0001 to 9999.9
• Admittance (Y), Conductance (G), Susceptance (B): 0.1 nS to >2 kS
• Phase Angle: −180° to +180°
Accuracy: ±0.05% for Z, R, X, L, C; ±0.0005 for dissipation factor; ±0.05% for quality factor (10°C to 30°C).
Drive Levels: AC drive 1.05 V to 5.0 V (0.05 V or 0.1 V steps) or 1 mA to 100 mA (1 mA or 2 mA steps). Automatic drive mode selection based on impedance range. Selectable down to 1 V or 20 mA.
DC Bias Option: 0 to +40 V dc bias voltage with 0 to +100 mA dc bias current. Optional /D2 module extends voltage range to −40 V to +40 V.
Measurement Speed: Up to 50 measurements per second with four selectable speed modes.
– Key Features
• 7-inch CRT display with microprocessor control and soft-key interface
• Non-volatile memory storage for selected measurement functions and conditions
• Display resolution up to 6 digits (dependent on measurement range)
• Rear panel safety link for DC bias inhibition or external bias supply connection
– Typical Applications
Component characterization, material property analysis, capacitor and inductor testing, impedance measurement across audio, RF, and power frequencies.
