The Yokogawa SB5310 Serial Data Analyzer captures and analyzes serial communication protocols in automotive and ECU development environments. It combines 4 analog channels with 8-bit logic analysis to decode FlexRay, CAN, LIN, UART, I²C, and SPI buses simultaneously. The instrument delivers 1 GHz bandwidth, 2.5 GS/s sampling per channel, and 6.25 MW memory depth, enabling detailed protocol decoding, error triggering, and statistical measurement across multiple serial standards.
Technical Specifications
• Bandwidth: 1 GHz
• Sampling Rate: 2.5 GS/s per channel
• Memory Depth: 6.25 MW (Mpts)
• Analog Channels: 4
• Logic Channels: 8-bit
• Supported Protocols: FlexRay, CAN, LIN, UART, I²C, SPI
– Key Features
FlexRay Analysis
• Eye-diagram analysis and electrical characterization of bus driver parameters
• Symbolic triggering, decoding, and trend display with FIBEX database support
• Error triggering on CRC, BSS, and FES violations
• BSS bit time interval measurement and statistical calculation
CAN Bus Analysis
• Symbolic triggering and decoding with DBC database integration
• Dedicated triggers for Start of Frame, ID, Data, Remote Frame, and Error Frame
• Combination bit conditions on ID and Data triggers
LIN Bus Analysis
• Protocol-specific error triggering (Parity, CheckSum, TimeOut)
• Simultaneous LIN revision 1.3 and 2.0 conformity analysis
UART, I²C, and SPI
• General-purpose and error-specific triggering (parity, framing errors)
• SPI analysis without CS source assignment (firmware 4.42+)
Acquisition and Display
• Advanced combination triggering across bus signals and analog channels
• History Memory with retroactive protocol analysis review
• State and bus display modes for parallel signal analysis
– Typical Applications
• ECU debugging and validation
• Automotive serial bus characterization
• Microprocessor parallel bus monitoring alongside serial protocol analysis
• Multi-protocol system integration testing
– Compatibility & Integration
Supports FIBEX and DBC database formats for automated protocol configuration and symbolic analysis.
