The Agilent/HP 70841B Pattern Generator is a modular plug-in instrument for the Agilent 70000 Modular Measurement System, designed to generate customizable digital patterns for stress testing, compliance validation, and receiver sensitivity characterization in communication devices. Operating across 100 Mb/s to 3 Gb/s, it delivers data output jitter below 15 ps rms and transition times of 120 ps (10%–90%) and 90 ps (20%–80%), enabling precise validation of logic designs and data transmission systems under realistic signal conditions.
Technical Specifications
• Operating Frequency: 100 Mb/s to 3 Gb/s
• Data Output Jitter: <15 ps rms
• Data Transition Times (10%–90%): <120 ps
• Data Transition Times (20%–80%): <90 ps
• Clock Transition Times (10%–90% at 3 GHz): <120 ps
• Module Size: 4-slot configuration
– Key Features
• PRBS test patterns: 2^31-1, 2^23-1, 2^15-1, 2^10-1, and 2^7-1 polynomials with inverted options
• Zero substitution capability for extended zero runs
• Variable mark density selectable at 1/16, 1/4, 1/2, 3/4, and 7/8 ratios
• User-defined word patterns with 16-bit programmable words
• Internal pattern storage: 8192 bits per store
• Disc pattern storage: Up to 4 Mbits
• Alternate patterns (A/B) with synchronization at pattern end
• Alternate words under rear-panel auxiliary input control
• Six front-panel I/O ports plus rear-panel connectivity
• Dedicated data, clock, and trigger outputs
• GPIB interface for computer control and instrument communication
• MSIB (Modular System Interface Bus) for high-speed inter-module communication
– Typical Applications
• Stress and compliance testing in communication devices
• Logic design verification
• Receiver sensitivity validation under realistic conditions
• Digital pattern generation for data transmission characterization
– Compatibility & Integration
Designed as a plug-in module for the Agilent/HP 70001A system mainframe. Integrates with Agilent 70000 MMS instruments including the 71603B Error Performance Analyzer and 71604B Pattern Generator. GPIB and MSIB interfaces enable integration with external test systems and modular measurement platforms.
