The Agilent/HP 8753C is a vector network analyzer delivering S-parameter measurements from 300 kHz to 6 GHz (with Option 006). This dual-channel instrument combines an integrated synthesized RF source, three tuned receivers, and advanced error correction to enable precise characterization of RF components across laboratory and production workflows.
Technical Specifications
Frequency & Source Performance
• Frequency range: 300 kHz to 6 GHz (with Option 006)
• Synthesized source with 1 Hz resolution and ±10 ppm accuracy
• Output power: -5 dBm to +20 dBm (>100 mW)
• Harmonics: ≤-25 dBc at 20 dBm; ≤-50 dBc at 0 dBm
• Non-harmonics: ≤-32 dBc at 20 dBm; ≤-55 dBc at 0 dBm
Dynamic Range & Accuracy
• Dynamic range: 100 dB (95 dB from 3–6 GHz)
• Dynamic accuracy: ±0.05 dB, ±0.3° over 50 dB input range
• Segmented calibration and interpolative error correction
Receiver Characteristics
• Three tuned receivers, 300 kHz to 6 GHz
• Sensitivity: -90 dBm (3 kHz BW, <3 GHz); -85 dBm (3–6 GHz)
• Maximum input level: 0 dBm
• Input crosstalk: -100 dB (300 kHz–1 GHz) to -75 dB (4.5–6 GHz)
Measurements & Display
• Full two-port S-parameter error correction with 1,601 measurement points
• Parameters: Magnitude, Phase, Group Delay, SWR, Real/Imaginary components
• Display formats: Linear, Logarithmic, Smith Charts, Polar Plots, List, Power, CW
• Two independent display channels
– Key Features
• Integrated test set for forward and reverse measurements via single connection
• Linear, logarithmic, list, power, and CW sweep modes
• Time-domain analysis capability (Option 010)
• Swept harmonic measurement support for advanced RF analysis
– Typical Applications
• RF component characterization and filter design
• System-level impedance and reflection analysis
• Device development requiring high dynamic range measurements
• Production network analysis with calibration accuracy enhancement
– Compatibility & Integration
Option 006 extends frequency coverage to 6 GHz. Option 010 enables time-domain analysis via Inverse Fourier Transform computation.
