The Agilent/Keysight E1429B is a single-slot C-size VXI digitizer module delivering 12-bit resolution at sampling rates up to 20 MSa/s for high-speed transient signal capture. Built for demanding test environments, this two-channel module combines flexible data acquisition with dual data paths—standard VXI bus and high-speed VXI Local Bus—to optimize throughput across different system architectures.
Technical Specifications
Digitizer Performance
• Resolution: 12 bits
• Maximum Sample Rate: 20 MSa/s
• Analog Input Channels: 2
• Memory per Channel: 512 kSa (segmentable)
Data Acquisition
• Programmable arm/trigger circuits for transient signal capture
• Pre- and post-trigger buffering: up to 128 data sets
• Non-volatile memory for data retention during power loss
Data Transfer
• Primary path: VXI data transfer bus
• Alternate path: VXI Local Bus for accelerated data streaming
Programming
• Command interface: SCPI (Standard Commands for Programmable Instruments)
• Access modes: Message-based and register-based
• On-board diagnostics: Self-test routines covering attenuators, amplifiers, A/D converters, memory, timebase, and digital circuits; accessible via power-up initialization or *TST command
Physical
• Form factor: C-size, 1-slot VXI module
– Key Features
• Dual-path architecture optimizes data transfer for mixed-speed acquisition workflows
• Segmentable memory enables efficient storage of multiple triggered events
• On-board voltage reference and comprehensive self-test suite streamline system verification
• Register-based programming support enables low-latency, high-throughput data operations
– Typical Applications
• Transient event capture and analysis in production test systems
• Multi-event data logging with pre- and post-trigger context
• Integrated measurement campaigns requiring high sampling density at moderate bandwidth
– Compatibility & Integration
Designed for VXIbus-based test systems with VXIplug&play framework support. Instrument drivers facilitate rapid integration into automated test environments.
