The Keysight E5061B is a 2-port network analyzer spanning 5 Hz to 3 GHz, delivering integrated low-frequency and RF measurement capabilities for component and circuit characterization. Built for R&D and production environments in wireless, aerospace, automotive, and medical industries, the instrument combines dual test ports—an S-parameter port (5 Hz to 3 GHz, 50 Ω) and a gain-phase port (5 Hz to 30 MHz, switchable 1 MΩ // 30 pF or 50 Ω)—with a standard DC bias source capable of ±40 Vdc sweep at 100 mA maximum. Dynamic range reaches 120 dB with trace noise of 0.005 dB rms at 1–3 GHz (IFBW = 10 Hz). Output power spans −45 dBm to +10 dBm across the full frequency range. The 10.4 inch LCD touch screen and Windows OS interface support USB, LAN, and optional GPIB connectivity for flexible test automation and data transfer.
Technical Specifications
• Frequency Range: 5 Hz to 3 GHz
• Dynamic Range: Up to 120 dB
• Output Power: −45 dBm to +10 dBm
• Trace Noise: 0.005 dB rms (1 MHz–3 GHz, IFBW = 10 Hz); 5 mdB rms (IFBW = 3 kHz/Auto)
• Test Ports: 2 (S-parameter, Gain-phase)
• System Impedance: 50 Ω or 75 Ω (configurable by test set)
• S-Parameter Port: 5 Hz to 3 GHz, 50 Ω
• Gain-Phase Port: 5 Hz to 30 MHz; input impedance switchable (1 MΩ // 30 pF or 50 Ω)
• DC Bias Source: 0 to ±40 Vdc, 100 mA maximum; superimposable to source signal
• Receiver Attenuator: 0 dB/20 dB (manually selectable per receiver)
• Display: 10.4 inch LCD touch screen
• Connectivity: USB, LAN, GPIB (optional)
• Dimensions: 254 mm W × 498 mm D
– Key Features
• Direct S-parameter measurement from 5 Hz to 3 GHz
• High-impedance probing via switchable gain-phase input
• Built-in probe power for external active probes
• Impedance analysis option for capacitor, inductor, and resonator characterization
• Time domain fault location analysis option for cable and connector diagnostics
• Internal manual receiver attenuation selection
– Typical Applications
• Component impedance and reflection measurement
• RF and low-frequency circuit analysis
• Cable and connector discontinuity detection
• DC-biased device characterization
– Compatibility & Integration
Supports USB, LAN, and optional GPIB interfaces for remote control and data logging in automated test environments.
