The Agilent/Keysight E5100A is a high-speed network analyzer engineered for rapid production-line testing of resonators, filters, and electronic components. It delivers measurement cycles as fast as 0.04 ms/point through optimized waveform analysis and high-speed processor architecture, directly reducing test time and cost. The instrument spans 10 kHz to 300 MHz (180 MHz variant also available), with selectable IF bandwidths from 10 Hz to 30 kHz enabling low-noise measurements and dynamic range exceeding 120 dB at 1 kHz IFBW. Accuracy is ±0.05 dB and ±0.3 degrees.
Technical Specifications
Frequency Range:
• 10 kHz to 300 MHz
• 10 kHz to 180 MHz (cost-optimized variant)
Measurement Speed:
• 0.04 ms/point (fastest sweep speed)
• Ramp sweep and step sweep modes
IF Bandwidth:
• 10 Hz to 30 kHz, selectable in 1, 1.5, 2, 3, 4, 5, 8 step increments
Dynamic Range:
• >120 dB (at IFBW = 1 kHz)
Accuracy:
• ±0.05 dB (amplitude)
• ±0.3 degrees (phase)
Output Power:
• Standard: −9 dBm to +11 dBm
• Extended range (Option 010): −48 dBm to +22 dBm
Frequency Stability (Option 1D5):
• 1 ppm
Input Impedance:
• 50 Ω nominal (standard)
• 50 Ω / 1 MΩ, 30 pF selectable (options available)
– Key Features
Measurement Parameters: Gain (amplitude ratio), phase, group-delay, amplitude, gain-phase, gain-delay, impedance, and admittance
Dynamic Accuracy: 120 dB dynamic range at 1 kHz IF bandwidth with fine-resolution bandwidth selection eliminates measurement fluctuation and noise floor constraints
Return Loss: 20 dB (SPC) across full frequency range
Spurious Performance: <−45 dBc non-harmonic signals (Option 001, −4 dBm output)
Display: 6.5-inch color LCD
Programming: Instrument BASIC and IBASIC automation support
Storage: Flexible disk drive (720 kB, 1.2 MB, 1.44 MB modes) and internal non-volatile memory
– Typical Applications
Resonator and filter characterization, component acceptance testing, production-line high-throughput screening, and impedance/admittance measurements in manufacturing environments
– Compatibility & Integration
Parallel I/O interfaces and BASIC-based programmability enable integration into automated test stations and legacy manufacturing systems.
