The Keysight U7108C is a single-pole, eight-throw (SP8T) electromechanical coaxial switch engineered for high-performance RF and microwave test systems. Operating from DC to 26.5 GHz with magnetic latching action, this terminated switch delivers the port density and switching reliability required in automated test environments. Each unused port is factory-terminated, enabling clean signal routing without external termination networks.
Technical Specifications
Switch Configuration
• Single-pole, eight-throw (SP8T) with terminated unused ports
• Frequency range: DC to 26.5 GHz
• Switching action: Default break-before-make; make-before-break achievable via simultaneous new/old drive pin selection
• Magnetic latching mechanism
RF Performance
• Isolation: Minimum 70 dB (DC to 3 GHz); minimum 63 dB at 26.5 GHz
• Low insertion loss and VSWR across the operating band
Control & Indicators
• TTL/5V CMOS compatible control options (Options 300, 500)
• Standard drive variants (Options 200, 400)
• Opto-electronic indicator with current interrupt detection
• Connectivity: Ribbon cable standard; optional solder terminals (Option 100) or 24-PIN DIP connector with 24-inch ribbon cable (Option 200)
Environmental Performance
• Operating temperature: −25 °C to +55 °C
• Non-operating temperature: −55 °C to +85 °C
• Operating humidity: 95% RH at 40 °C
• Temperature cycling validated to −55 °C / +85 °C over 10 cycles per MIL-STD-202F
– Key Features
• Highly repeatable switching performance for measurement accuracy in ATS
• Eight-port configuration minimizes calibration cycles and enables simultaneous multi-DUT or multi-channel DUT testing
• Stringent manufacturing specifications ensure long-term reliability in continuous-duty test applications
– Typical Applications
• Automated test and measurement systems
• Signal monitoring and routing
• Multi-DUT and multi-channel device test scenarios
• RF/microwave signal switching up to 26.5 GHz
– Compatibility & Integration
Designed for integration with Keysight modular instrument platforms and test interfaces supporting TTL/CMOS control logic.
