The Anritsu 37269E is a passive vector network analyzer that measures S-parameters and user-defined wave quantities across the 40 MHz to 40 GHz frequency band. Purpose-built for characterizing passive RF devices including filters, antennas, and transmission line networks, it delivers high dynamic range and measurement accuracy in both manual and automated laboratory environments.
Technical Specifications
Frequency coverage spans 40 MHz to 40 GHz. The instrument measures S11, S21, S22, S12, and user-defined combinations of wave quantities a1, a2, b1, and b2. Maximum 1601 data points with continuous sweep capability from N = 2 to 1601 discrete points per measurement.
Measurement domains include frequency domain, CW draw, and optional high-speed time (distance) domain. Display formats encompass log magnitude, phase, log magnitude and phase, Smith chart (impedance and admittance), linear polar, log polar, group delay, linear magnitude, linear magnitude and phase, real, imaginary, real and imaginary, SWR, and power out.
Test ports are universal K male connectors (standard); Option 15 provides K-female ports. Calibration methods include SOLT, offset short, waveguide, commercially available multiple line kits for metrology-grade LRL/LRM, adapter removal, and AutoCal® automatic precision modules for coaxial calibrations to 40 GHz.
– Key Features
• Swept power and frequency gain compression measurements for amplifier characterization
• Direct frequency translation analysis via NxN multiple device solution utility
• Multiport testing with balanced and differential measurement support
• Optoelectronic device measurement with de-embedding and photo detector transfer function analysis
• Embedding and de-embedding routines for fixture removal and structure effect simulation
• 8 GB SD card internal storage for measurement, calibration data, and front-panel setups
• USB Type A port for external memory device connectivity (text, S2P, bitmap export)
• Dual GPIB ports (system and dedicated) for external controller integration
• Option 4A secure storage on separate SD card
– Typical Applications
Amplifier testing, mixer characterization, multiport device analysis, optoelectronic component evaluation, and fixture de-embedding workflows.
– Compatibility & Integration
USB memory devices and SD card storage enable portable data management. Dual GPIB interface supports integration into automated test systems and external control architectures.
