The Anritsu MS9720B is a high-performance optical spectrum analyzer engineered for precise characterization of optical devices and WDM systems. Operating across the C-band, it delivers 58 dB dynamic range, -87 dBm sensitivity, and 0.03 nm minimum resolution bandwidth for detailed spectral analysis. Built-in acetylene calibration and an integrated SLD light source enable automated wavelength accuracy to ±20 pm, while multi-channel WDM analysis, NF measurement, PMD calculation, and SMSR capabilities address demanding R&D, manufacturing, and quality control workflows in optical communications.
## Technical Specifications
**Wavelength Performance**
• Wavelength range: 1450 nm to 1650 nm
• Wavelength accuracy: ±20 pm (1530–1570 nm with reference source)
• Minimum resolution bandwidth: 0.03 nm
• Dynamic range: 58 dB at 1 nm from signal
• Optical sensitivity: -87 dBm
• Maximum input level: +30 dBm (attenuator ON)
**Internal Light Source**
• Type: SLD (Super Luminescent Diode)
• Output spectrum: 1450 nm to 1650 nm
• Output level: -40 dBm minimum (1 nm RBW at 1550 nm)
**Measurement Functions**
• WDM analysis: Up to 128 channels with peak wavelength, level, and SNR per channel
• NF measurement: ASE calculation using interpolation and level-fitting methods
• PMD calculation: Fixed-analysis function for Polarization Mode Dispersion
• SMSR measurement: Signal-to-Modulation Side-Band Ratio analysis
**System Interface**
• Wavelength calibration: Automatic via acetylene absorption spectrum
• Monitor output: VGA connector
• Communication: GPIB and RS-232C
• Data storage: 3.5-inch floppy disk drive
**Environmental**
• Operating temperature: 0°C to +50°C
• Storage temperature: –20°C to +60°C
• Relative humidity: ≤90% (non-condensing)
• Power: 85–132 Vac / 172–250 Vac, 47.5–63 Hz, 150 VA max
• Dimensions: 320 (W) × 177 (H) × 350 (D) mm
## Key Features
• Automatic wavelength calibration eliminates manual reference procedures
• Integrated SLD source simplifies benchtop deployment and reduces external component requirements
• 58 dB dynamic range resolves weak sidebands and noise floor analysis in complex spectra
• Sub-0.1 nm resolution bandwidth enables detailed modulation sideband characterization
## Typical Applications
• WDM system development and channel verification across C-band
• Optical amplifier performance assessment and ASE noise profiling
• Laser and light source spectral purity validation
• Transmission system commissioning and field troubleshooting
## Compatibility & Integration
GPIB and RS-232C interfaces enable automated test sequences and remote instrument control. Legacy data archival through floppy disk drive supports legacy workflows; measurement files integrate with instrument automation platforms via standard communication protocols.
