The EXFO FIP-400-P-DUAL is a dual-magnification fiber inspection probe engineered for high-resolution end-face examination of fiber optic connectors. It delivers theoretical resolution below 2 µm with detection capability down to 1 µm, enabling identification of scratches, contamination, and surface defects across MPO/MTP and single-fiber connector types without adapter reconfiguration. The probe features adjustable dual magnification with selectable fields of view: low magnification at 625 µm × 464 µm and high magnification at 412 µm × 306 µm. Coaxial blue LED illumination ensures consistent lighting geometry for accurate defect assessment.
Technical Specifications
• Resolution: Theoretical < 2 µm; detection capability < 1 µm
• Field of View (Low Magnification): 625 µm × 464 µm
• Field of View (High Magnification): 412 µm × 306 µm
• Magnification: Dual, adjustable
• Light Source: Blue LED, coaxial configuration
• Probe Connector: EXFO probe port type (8-pin mini-DIN)
• Focus Control: Adjustable on probe
• Image Capture: On-probe capture button
• Power: Rechargeable Li-Ion battery (handheld display models)
– Key Features
• Interchangeable inspection tips for 2.5 mm, 1.25 mm, FC/SC, and LC connector families
• Support for both PC standard (PC) and angled (APC) ferrule geometries
• Probe dimensions: 170 mm × 32 mm × 38.5 mm (without tip cap)
• Handheld display unit: 190 mm × 99 mm × 50 mm; weight approximately 0.3 kg
• USB 2.0 connectivity via optional converter for PC-based inspection workflows
– Compatibility & Integration
The FIP-400-P-DUAL integrates with EXFO test platforms including FTB-200, FOT-930, FTB-1 (firmware-dependent), FTB-500, and IQS-600. Direct EXFO probe port connection or PC connectivity via USB converter adapter enables flexible deployment across field, lab, and data center inspection environments.
