The Fluke 8012A is a 3.5-digit benchtop digital multimeter engineered for precision measurement across DC and AC circuits, resistance networks, and semiconductor testing. It delivers true-rms AC measurement capability, dual-slope integration A/D conversion for noise-free readings, and comprehensive overload protection to 6 kV for 10 microseconds. The LCD display and wide functional range make it suitable for laboratory, field service, and industrial troubleshooting.
Technical Specifications
Voltage & Current Measurement
• DC Voltage: 100 µV to 1000 V
• AC Voltage (True RMS): 10 mV to 750 V; response time 2 seconds maximum (DC: 1 second)
• Volt-Hertz Product: 10⁷ maximum (200 V maximum @ 50 kHz)
• Frequency Response: Typically ±3 dB at 200 kHz
• Common Mode Noise Rejection: >60 dB at 50 Hz and 60 Hz (1 kΩ unbalanced)
• Input Impedance: 10 MΩ in parallel with <100 pF
• Crest Factor Range: 1.0 to 3.0
• AC Overload Protection: 750 V rms or 1000 V peak continuous
• DC Current: 100 nA to 2 A; accuracy ±(0.3% of reading + 1 digit)
• AC Current (True RMS): 10 µA to 2 A
• Current Overload Protection: 2 A/250 V fuse in series with 3 A/600 V fuse
Resistance & Conductance
• Resistance: 1 mΩ to 20 MΩ across eight ranges
• Low Resistance Ranges: 2 Ω and 20 Ω with resolutions of 1 mΩ and 10 mΩ (maximum open circuit voltage 16 V)
• Standard Resistance Ranges: 200 Ω to 20 MΩ with open circuit voltage <3.5 V
• Conductance: Up to 10,000 MΩ equivalent resistance; ranges 2 mS, 20 µS, 200 nS
Diode Testing
Diode test ranges (2 kΩ, 200 kΩ, 20 MΩ) supply <3.5 V open circuit voltage for PN junction verification.
– Key Features
• Dual-slope integration A/D conversion for stable, accurate measurements
• True-rms AC measurement with extended frequency response to 200 kHz
• Eight resistance ranges with dedicated low-ohm capability (1 mΩ resolution)
• LCD display with 3.5-digit resolution
• Transient protection to 6 kV for 10 microseconds
• Long-term calibration stability (1 year)
– Typical Applications
Laboratory testing, field service diagnostics, industrial troubleshooting, semiconductor component verification, and circuit analysis requiring accurate AC and DC measurements across wide dynamic ranges.
