The HP/Agilent 35676B is a 75 Ohm reflection/transmission test kit engineered for precise S-parameter characterization on HP 3577A and 3577B network analyzers. This test set enables calibrated complex reflection and transmission measurements across 5 Hz to 200 MHz, supporting both single-trace and dual-trace concurrent calibration routines. The 35676B integrates 50 Ohm and 75 Ohm components to interface with the 50 Ohm 3577A analyzer while presenting 75 Ohm test ports to the device under test.
## Technical Specifications
• **Frequency Range:** 5 Hz to 200 MHz
• **Test Port Impedance:** 75 Ohms
• **Connector Type:** Type N (75 Ohm)
• **Maximum RF Input Power:** 0 dBm or less (signal divider to RECEIVER B port)
• **Weight:** 1380 g
## Key Features
• Dual-trace calibration capability enables reflection and transmission calibration performed simultaneously using both network analyzer traces
• Transmission calibration via HP 3577A NORMALIZE function with through-connection geometry
• Direct mechanical mounting of signal divider to HP 3577A mainframe
• Internal calibration integration with analyzer calibration routines—no external calibration required
• Reflection measurements (S11, S22) and transmission measurements (S21, S12) with full complex data
• Impedance parameter extraction in conjunction with network analyzer processing
## Typical Applications
• Component S-parameter characterization for passive and active RF devices
• Filter, amplifier, and antenna circuit performance evaluation
• Quality control validation against S-parameter specifications
• Impedance matching verification in subsystem integration
• Component research and development characterization
## Compatibility & Integration
Designed exclusively for HP 3577A and HP 3577B network analyzers. The signal divider mounts directly to the 3577A; all Type N connectors maintain 75 Ohm system impedance at test ports.
