The HP/Agilent 4145B Semiconductor Parameter Analyzer is a DC characterization instrument for precise electrical measurement and control of semiconductor devices and materials. Four programmable Source Monitor Units (SMUs) enable voltage sourcing with current monitoring, current sourcing with voltage monitoring, or common-mode operation. The analyzer performs I-V and C-V characterization with linear or logarithmic sweep capabilities, delivering measurement data across up to 1150 points with 4-1/2 digit voltage resolution and 4-digit current resolution. Results display in graphic, list, and matrix formats on a fully interactive graphics display. Built-in 3.5-inch floppy disk storage preserves measurement programs and data files.
Technical Specifications
• Voltage sourcing and measurement: 1 mV to 100 V with 4-1/2 digit resolution
• Current sourcing and measurement: 1 pA to 100 mA with 4-digit resolution (50 fA minimum)
• Four programmable SMUs: Each operates in voltage source/current monitor, current source/voltage monitor, or common mode (0 V, 105 mA compliance)
• Current source accuracy: ±1% of range +10 pA
• Output impedance: 0.4 Ω residual resistance
• Input impedance: 10¹² Ω
• Capacitive load rating: ≥1000 pF
• Sweep modes: Linear or logarithmic variable sweeps; staircase multi-variable sweeps; time-domain measurements up to 85 minutes with 10 ms minimum interval
• Maximum data points: 1150 measurement and display points; 1024 for single VAR 1 sweep; 1024 for time-domain sweep
• Automatic ranging: Applied across all measurement scales
• Storage capacity: 630 Kbytes per 3.5-inch disk; approximately 240 programs or 105 data files per disk
– Key Features
• Four independent SMUs for multi-terminal device characterization
• Automatic ranging across current and voltage measurements
• High input impedance (10¹² Ω) minimizes loading effects
• Extended time-domain capability for transient and drift analysis
• Programmable sweep control with mixed linear/logarithmic modes
– Typical Applications
• Device parameter extraction for CAD model development
• Material and component evaluation
• DC electrical characterization of diodes, transistors, and ICs
• Incoming and outgoing component inspection
• Quality control and device screening
– Compatibility & Integration
Built-in storage enables offline data analysis and program retention. Interactive graphics display supports real-time parameter monitoring and result visualization during measurement sequences.
